Presentation 2006-08-24
Durability of Optical Connectors with Scratched End-Face
Ryo NAGASE, Masao INOUE, Junji TAIRA, Masato SHIINO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We had done the high power optical incidence test and the cleaning test of soiled endface about the scratched physical contact type fiber optic connectors. After these tests, there is no degradation on the fiber endfaces of the scratched fiber optic connectors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical connector / PC connector / scratched fiber endface / high power optical incidence
Paper # EMD2006-34,CPM2006-64,OPE2006-76,LQE2006-41
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Conference Information
Committee LQE
Conference Date 2006/8/17(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Durability of Optical Connectors with Scratched End-Face
Sub Title (in English)
Keyword(1) optical connector
Keyword(2) PC connector
Keyword(3) scratched fiber endface
Keyword(4) high power optical incidence
1st Author's Name Ryo NAGASE
1st Author's Affiliation NTT Photonics Labs., Nippon Telegraph and Telephone Corporation:JIS Fiber Optic Connector Standardization Committee()
2nd Author's Name Masao INOUE
2nd Author's Affiliation Hirose Electric Co., Ltd.:JIS Fiber Optic Connector Standardization Committee
3rd Author's Name Junji TAIRA
3rd Author's Affiliation Seikoh Giken Co., Ltd.:JIS Fiber Optic Connector Standardization Committee
4th Author's Name Masato SHIINO
4th Author's Affiliation The Furukawa Electric Co., Ltd.:JIS Fiber Optic Connector Standardization Committee
Date 2006-08-24
Paper # EMD2006-34,CPM2006-64,OPE2006-76,LQE2006-41
Volume (vol) vol.106
Number (no) 215
Page pp.pp.-
#Pages 5
Date of Issue