Presentation 2006-08-24
Durability of Optical Connectors with Scratched End-Face
Ryo NAGASE, Masao INOUE, Junji TAIRA, Masato SHIINO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We had done the high power optical incidence test and the cleaning test of soiled endface about the scratched physical contact type fiber optic connectors. After these tests, there is no degradation on the fiber end faces of the scratched fiber optic connectors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical connector / PC connector / scratched fiber endface / high power optical incidence
Paper # EMD2006-34,CPM2006-64,OPE2006-76,LQE2006-41
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Conference Information
Committee OPE
Conference Date 2006/8/17(1days)
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Paper Information
Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Durability of Optical Connectors with Scratched End-Face
Sub Title (in English)
Keyword(1) optical connector
Keyword(2) PC connector
Keyword(3) scratched fiber endface
Keyword(4) high power optical incidence
1st Author's Name Ryo NAGASE
1st Author's Affiliation JIS Fiber Optic Connector Standardization Committee:NTT Photonics Labs., Nippon Telegraph and Telephone Corporation()
2nd Author's Name Masao INOUE
2nd Author's Affiliation JIS Fiber Optic Connector Standardization Committee:Hirose Electric Co., Ltd.
3rd Author's Name Junji TAIRA
3rd Author's Affiliation JIS Fiber Optic Connector Standardization Committee:Seikoh Giken Co., Ltd.
4th Author's Name Masato SHIINO
4th Author's Affiliation JIS Fiber Optic Connector Standardization Committee:The Furukawa Electric Co., Ltd.
Date 2006-08-24
Paper # EMD2006-34,CPM2006-64,OPE2006-76,LQE2006-41
Volume (vol) vol.106
Number (no) 214
Page pp.pp.-
#Pages 5
Date of Issue