Presentation 2006-08-25
Temperature and Electric Field Dependences of Optical Damage in Proton-Exchanged Waveguides Formed on MgO-Doped Lithium Niobate Crystals
Akira Ikeda, Yukiko Otsuka, Yoichi Fujii,
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Abstract(in English) There has been a great demand for the electrooptic devices for both the optical communication and sensor applications, and the nonlinear-optical devices. The properties of these devices are highly dependent on the waveguide fabrication process. In order to find the waveguide fabrication techniques and the optimum fabrication conditions suitable for each devices, the exact estimation of the optical and physical properties of the waveguides becomes necessary. The proton-exchanged waveguide formed on MgO-doped lithium niobate (LN) crystals is expected to be resistant to optical damage (photorefractive effect). So this crystal is the attractive material for optical information and processing applications. In this report, the temperature and electric field dependences of the photorefractive effect are investigated.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) optical waveguides / lithium niobate / photorefractive effect / proton-exchange / photorefractive sensitivity
Paper # OFT2006-28
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Committee OFT
Conference Date 2006/8/17(1days)
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Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Temperature and Electric Field Dependences of Optical Damage in Proton-Exchanged Waveguides Formed on MgO-Doped Lithium Niobate Crystals
Sub Title (in English)
Keyword(1) optical waveguides
Keyword(2) lithium niobate
Keyword(3) photorefractive effect
Keyword(4) proton-exchange
Keyword(5) photorefractive sensitivity
1st Author's Name Akira Ikeda
1st Author's Affiliation Department of Electronics and Computer Science, College of Science and Technology, Nihon University()
2nd Author's Name Yukiko Otsuka
2nd Author's Affiliation Institute of Industial Science, University of Tokyo
3rd Author's Name Yoichi Fujii
3rd Author's Affiliation Department of Electronics and Computer Science, College of Science and Technology, Nihon University
Date 2006-08-25
Paper # OFT2006-28
Volume (vol) vol.106
Number (no) 211
Page pp.pp.-
#Pages 6
Date of Issue