| Presentation | 2006/6/26 The Guideline of Tolerable Vth Fluctuation for MCML (MOS Current Mode Logic) Inverter Circuit(Session 8A Silicon Devices V) Hyoung-jun NA, Maki SUEMITSU, Tetsuo ENDOH, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, the guideline of tolerable threshold voltage (Vth) fluctuation of MOS Current Mode Logic (MCML) was presented by using HSPICE simulations. The dependence of bias offset voltage ΔV_B, that is defined as (base voltage of output waveform) - (base voltage of input wave form), on Vth fluctuation of NMOS and PMOS was investigated. The tolerable Vth fluctuation of NMOS and PMOS that satisfies ΔV_B≦50mV and ΔV_B≦100mV in MCML inverter was shown, respectively. With using this proposed guideline of tolerable Vth fluctuation, we clarified that in order to improve the stability of MCML inverter, it is effective to suppress the Vth fluctuation of NMOS. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | MCML / Vth Fluctuation / Stability / HSPICE Simulation / NMOS / PMOS |
| Paper # | ED2006-103,SDM2006-111 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2006/6/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | The Guideline of Tolerable Vth Fluctuation for MCML (MOS Current Mode Logic) Inverter Circuit(Session 8A Silicon Devices V) |
| Sub Title (in English) | |
| Keyword(1) | MCML |
| Keyword(2) | Vth Fluctuation |
| Keyword(3) | Stability |
| Keyword(4) | HSPICE Simulation |
| Keyword(5) | NMOS |
| Keyword(6) | PMOS |
| 1st Author's Name | Hyoung-jun NA |
| 1st Author's Affiliation | Center for Interdisciplinary Research, Tohoku University() |
| 2nd Author's Name | Maki SUEMITSU |
| 2nd Author's Affiliation | Center for Interdisciplinary Research, Tohoku University |
| 3rd Author's Name | Tetsuo ENDOH |
| 3rd Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| Date | 2006/6/26 |
| Paper # | ED2006-103,SDM2006-111 |
| Volume (vol) | vol.106 |
| Number (no) | 138 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |