Presentation 2006/6/26
The Dependence of Remaining Carbon in the Electrical Property of the Gate Insulator Film on SiC at Low Temperature Insulator Formation(Session 6B Power Devices,AWAD2006)
Koutarou Tanaka, Hiroaki Tanaka, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper investigated the influence on the electrical property of remaining carbon in the insulator film of MOS structure on 4H-SiC. The insulator films were formed by PECVD and radical oxynitridation using microwave-excited high-density plasma with NO gas. The oxide fixed charge and the interface trap density can be dramatically reduced by NO gas radical oxynitridation after oxide film formed by PECVD compared with by direct oxynitridation on 4H-SiC. It is confirmed that the electrical property is improved as the decrease of remaining carbon in the insulator film.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SiC / Remaining carbon / Microwave-excited high-density plasma
Paper # ED2006-88,SDM2006-96
Date of Issue

Conference Information
Committee SDM
Conference Date 2006/6/26(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The Dependence of Remaining Carbon in the Electrical Property of the Gate Insulator Film on SiC at Low Temperature Insulator Formation(Session 6B Power Devices,AWAD2006)
Sub Title (in English)
Keyword(1) SiC
Keyword(2) Remaining carbon
Keyword(3) Microwave-excited high-density plasma
1st Author's Name Koutarou Tanaka
1st Author's Affiliation Graduate School of Engineering, Tohoku University()
2nd Author's Name Hiroaki Tanaka
2nd Author's Affiliation Graduate School of Engineering, Tohoku University
3rd Author's Name Akinobu Teramoto
3rd Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
4th Author's Name Shigetoshi Sugawa
4th Author's Affiliation Graduate School of Engineering, Tohoku University
5th Author's Name Tadahiro Ohmi
5th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
Date 2006/6/26
Paper # ED2006-88,SDM2006-96
Volume (vol) vol.106
Number (no) 138
Page pp.pp.-
#Pages 5
Date of Issue