Presentation 2006/6/26
A Large-Signal Model of RF LDMOS with Skin Effects of Power Combining Structures(Session 6B Power Devices,AWAD2006)
Jeonghu HAN, Changkun PARK, Songcheol HONG,
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Abstract(in English) An empirical large signal model for RF LDMOS transistors is presented to have good accuracy for all device operating regions up to 20GHz. Skin effects of combining metal structures, non-reciprocal capacitance, and non-quasi-static effect are considered in this model. A power transistor of 1.92mm gate width is fabricated in an LDMOS technology which is compatible with a 0.3-μm CMOS process. The LDMOS transistor is modeled and compared with measured data. A load-pull measurement results are exactly predicted by the proposed model, which show a PldB of 20dBm, a gain of 19dB, and PAE (power-added-efficiency) of 62% at the PldB.
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Keyword(in English) Empirical model / large signal model / power MOSFET / RF LDMOS
Paper # ED2006-87,SDM2006-95
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Committee SDM
Conference Date 2006/6/26(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Large-Signal Model of RF LDMOS with Skin Effects of Power Combining Structures(Session 6B Power Devices,AWAD2006)
Sub Title (in English)
Keyword(1) Empirical model
Keyword(2) large signal model
Keyword(3) power MOSFET
Keyword(4) RF LDMOS
1st Author's Name Jeonghu HAN
1st Author's Affiliation Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology (KAIST)()
2nd Author's Name Changkun PARK
2nd Author's Affiliation Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology (KAIST)
3rd Author's Name Songcheol HONG
3rd Author's Affiliation Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology (KAIST)
Date 2006/6/26
Paper # ED2006-87,SDM2006-95
Volume (vol) vol.106
Number (no) 138
Page pp.pp.-
#Pages 4
Date of Issue