| Presentation | 2006-07-28 High Frequency Magnetic Imaging with a High Sensitivity Integrated Magnetic Probe Satoshi AOYAMA, Shoji KAWAHITO, MASAHIRO Yamaguchi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A novel magnetic probe has been designed and fabricated in a 0.15μm five-metal CMOS-SOI technology, in order to achieve both high sensitivity and high spatial resolution. A detecting coil, a 2-stage differential amplifier, a differential to single-ended converter, an output buffer and other peripheral circuits are all integrated on a single chip. The probe has a feature to distinguish magnetic field from the detected electromagnetic emissions, by means of a 2-turn differential coil structure and a circuit technique of a wideband differential-to-single-ended converter with the high common mode rejection. A 2D magnetic distribution map has been drawn by the fabricated active probe, and the obtained image is finer than that of a shielded loop coil. Furthermore, the concurrent measurement of the magnetic field with three aligned minute active probes has been demonstrated using electrical switching. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Magnetic Probe / Active Probe / Array / Near Field Measurement / CMOS-SOI / EMC / EMI |
| Paper # | ICD2006-72 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2006/7/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | High Frequency Magnetic Imaging with a High Sensitivity Integrated Magnetic Probe |
| Sub Title (in English) | |
| Keyword(1) | Magnetic Probe |
| Keyword(2) | Active Probe |
| Keyword(3) | Array |
| Keyword(4) | Near Field Measurement |
| Keyword(5) | CMOS-SOI |
| Keyword(6) | EMC |
| Keyword(7) | EMI |
| 1st Author's Name | Satoshi AOYAMA |
| 1st Author's Affiliation | Shizuoka University() |
| 2nd Author's Name | Shoji KAWAHITO |
| 2nd Author's Affiliation | Research Institute of Electronics, Shizuoka University |
| 3rd Author's Name | MASAHIRO Yamaguchi |
| 3rd Author's Affiliation | Tohoku University |
| Date | 2006-07-28 |
| Paper # | ICD2006-72 |
| Volume (vol) | vol.106 |
| Number (no) | 189 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |