Presentation	2006-07-27 A Signal Measurement System using On-Chip Multi-Channel Waveforme Monitor Takushi HASHIDA, Koichiro NOGUCHI, Makoto NAGATA,
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Abstract(in English)	This paper describes measurement system consisted of a FPGA board and on-chip multi-channel waveforme monitor circuits, toward a mixed-signal LSI diagnosis. Proposed system proceeded measurement automatically in various circuits and conditions, controlling with a simple script file on PC. As a result of evaluating proposed system which adapted 0.18μm CMOS test-chip, we achieved on-chip long-term analog waveform measurements at 250ms/sample.
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Keyword(in English)	Mixed signal LSI / On-chip testing
Paper #	ICD2006-64
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Committee	ICD
Conference Date	2006/7/20(1days)
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Registration To	Integrated Circuits and Devices (ICD)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	A Signal Measurement System using On-Chip Multi-Channel Waveforme Monitor
Sub Title (in English)
Keyword(1)	Mixed signal LSI
Keyword(2)	On-chip testing
1st Author's Name	Takushi HASHIDA
1st Author's Affiliation	Department of Computer and Systems Engineering, Graduate School of Science and Technology, Kobe University()
2nd Author's Name	Koichiro NOGUCHI
2nd Author's Affiliation	Department of Informatics and Electoronics, Graduate School of Science and Technology, Kobe University
3rd Author's Name	Makoto NAGATA
3rd Author's Affiliation	Department of Computer and Systems Engineering, Faculty of Engineering, Kobe University
Date	2006-07-27
Paper #	ICD2006-64
Volume (vol)	vol.106
Number (no)	189
Page	pp.pp.-
#Pages	6
Date of Issue