Presentation 2006-07-27
Evaluation of Digital Crosstalk Noise to fully Differential VCO
Akihiro Toya, Yoshitaka Murasaka, Takafumi Ohmoto, Atsushi Iwata,
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Abstract(in English) In accordance with the rapid increase of operation frequencies of CMOS circuits, radio-frequency system-on-a-chip (RF-SOC) that integrates GHz-RF circuits and large-scale digital circuits becomes a key devices for wireless systems and high speed networks. To develop high performance RF-SOC, high quality PLL (Phase-Locked -Loop) in the presence of cross talk noise generated by high-speed and large-scale digital circuits are required as oscillators or clock generators. We designed a test chip including a proposed differential input VCO, CMOS logic circuits and substrate noise detectors using a 0.25um CMOS technology, and measured characteristics of output jitter of the VCO to investigate the effect of the substrate crosstalk noise. As a result, the proposed differential input VCO is high tolerance for low-frequency noise in comparison with a conventional single-input VCO.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) VCO / Substrate noise / Cross-talk noise / Cycle jitter / Cycle-to-cycle jitter
Paper # ICD2006-60
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Conference Date 2006/7/20(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Digital Crosstalk Noise to fully Differential VCO
Sub Title (in English)
Keyword(1) VCO
Keyword(2) Substrate noise
Keyword(3) Cross-talk noise
Keyword(4) Cycle jitter
Keyword(5) Cycle-to-cycle jitter
1st Author's Name Akihiro Toya
1st Author's Affiliation Hiroshima University()
2nd Author's Name Yoshitaka Murasaka
2nd Author's Affiliation A-R-Tec Corp.
3rd Author's Name Takafumi Ohmoto
3rd Author's Affiliation A-R-Tec Corp.
4th Author's Name Atsushi Iwata
4th Author's Affiliation Hiroshima University:A-R-Tec Corp.
Date 2006-07-27
Paper # ICD2006-60
Volume (vol) vol.106
Number (no) 189
Page pp.pp.-
#Pages 6
Date of Issue