Presentation | 2006-07-06 NDE System Utilizing SQUID Picovoltmeter and Cooled Normal Pickup Coil Daisuke YAMASAKI, Kazuya TAZHO, Keiji ENPUKU, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Nondestructive evaluation (NDE) system utilizing a cooled normal pickup coil and a high-T_c superconducting quantum interference device (SQUID) picovoltmeter was performed both experimentally and analytically. In the experiment, we successfully detected a small crack on the back surface of a Cu plate by moving the coil in an unshielded environment. First, we developed a method of avoiding the drift of the detected signal that was caused by the variance of lift-off. Next, two dimensional mapping of the magnetic field from the crack was obtained, from which position and size of the crack were estimated. Finally, we clarified the dependences of the detected signal on the excitation frequency and the thickness of the Cu plate. It was shown that an optimum frequency that maximizes the detected signal exists. Because this frequency changed with the thickness of the Cu plate, the frequency dependence could be used to estimate the depth of the crack from the surface of the Cu plate. The experimental results were analyzed taking into account the phase and amplitude of the signal field caused by the crack. Good agreement was obtained between experiment and analysis. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SQUID picovoltmeter / cooled pickup coil / NDE / crack depth |
Paper # | SCE2006-20 |
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Committee | SCE |
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Conference Date | 2006/6/29(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | NDE System Utilizing SQUID Picovoltmeter and Cooled Normal Pickup Coil |
Sub Title (in English) | |
Keyword(1) | SQUID picovoltmeter |
Keyword(2) | cooled pickup coil |
Keyword(3) | NDE |
Keyword(4) | crack depth |
1st Author's Name | Daisuke YAMASAKI |
1st Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University() |
2nd Author's Name | Kazuya TAZHO |
2nd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
3rd Author's Name | Keiji ENPUKU |
3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
Date | 2006-07-06 |
Paper # | SCE2006-20 |
Volume (vol) | vol.106 |
Number (no) | 139 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |