| Presentation | 2006-06-30 Structure and Physical Properties of Poly (di-methyl silane) and Poly (di-hexyl silane) Thin Films Shoji FURUKAWA, Hidetaka OHTA, Hitoshi ARAKAWA, Takashi YASUDA, Akihiko KATSUKI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Thin films of poly (di-methyl silane) and poly (di-hexyl silane) have been prepared by the vacuum evaporation technique and casting method, respectively. And the structure and orientation of the films obtained are examined by the X-ray diffraction method. The orientation of the silicon backbone (all-trans conformation) of poly (di-methyl silane) can be controlled by changing evaporation rate, substrate temperature, and vacuum pressure during the deposition. On the other hand, poly (di-hexyl silane) is solved in organic solvent at room temperature. Therefore, poly (di-hexyl silane) thin films are fabricated by the wet process. From the X-ray diffraction measurement, it is found that the direction of the silicon backbone (all-trans conformation) of poly (di-hexyl silane) molecule is parallel to the substrate surface. The reason is discussed on the bases of the molecular structure and packing of poly (di-hexyl silane). Electrical property of the poly (di-methyl silane) thin film is also examined, and the result is discussed on the bases of the molecular structure and packing of poly (di-methyl silane). |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Poly (di-methyl silane) / Poly (di-hexyl silane) / X-ray Diffraction / Orientation / Molecular Structure |
| Paper # | EMD2006-13,CPM2006-37,OME2006-47 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2006/6/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Structure and Physical Properties of Poly (di-methyl silane) and Poly (di-hexyl silane) Thin Films |
| Sub Title (in English) | |
| Keyword(1) | Poly (di-methyl silane) |
| Keyword(2) | Poly (di-hexyl silane) |
| Keyword(3) | X-ray Diffraction |
| Keyword(4) | Orientation |
| Keyword(5) | Molecular Structure |
| 1st Author's Name | Shoji FURUKAWA |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Hidetaka OHTA |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Hitoshi ARAKAWA |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Takashi YASUDA |
| 4th Author's Affiliation | Kyushu Institute of Technology |
| 5th Author's Name | Akihiko KATSUKI |
| 5th Author's Affiliation | Kyushu Institute of Technology |
| Date | 2006-06-30 |
| Paper # | EMD2006-13,CPM2006-37,OME2006-47 |
| Volume (vol) | vol.106 |
| Number (no) | 131 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |