| Presentation | 2006-05-11 A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences Atsushi IZUKURA, Ryusuke TSUCHIDA, Kunihiko KUDOU, Daisaburo YOSHIOKA, Akio TSUNEDA, Takahiro INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Linear feedback shift registers (LFSRs) are extensively used in built-in self-test (BIST) as a test pattern generator (TPG). In this paper, we use extended LFSRs (e-LFSRs) and chaotic sequences for BIST in order to investigate the relationship between statistical properties of test patterns and fault coverage, where ISCAS'85 benchmark circuits are used. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / TPG / LFSR / chaotic sequence / fault coverage |
| Paper # | NLP2006-1 |
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| Conference Information | |
| Committee | NLP |
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| Conference Date | 2006/5/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Nonlinear Problems (NLP) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | TPG |
| Keyword(3) | LFSR |
| Keyword(4) | chaotic sequence |
| Keyword(5) | fault coverage |
| 1st Author's Name | Atsushi IZUKURA |
| 1st Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University() |
| 2nd Author's Name | Ryusuke TSUCHIDA |
| 2nd Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University |
| 3rd Author's Name | Kunihiko KUDOU |
| 3rd Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University |
| 4th Author's Name | Daisaburo YOSHIOKA |
| 4th Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University |
| 5th Author's Name | Akio TSUNEDA |
| 5th Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University |
| 6th Author's Name | Takahiro INOUE |
| 6th Author's Affiliation | Department of Conputer Science and Electrical Engineering, Kumamoto University |
| Date | 2006-05-11 |
| Paper # | NLP2006-1 |
| Volume (vol) | vol.106 |
| Number (no) | 30 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |