Presentation 2006-05-19
InGaPN/GaPN Quantum Well Structures for Si/III-V-N Optoelectronic Integrated Circuits
Kazuyuki UMENO, Sung Man KIM, Yuzo FURUKAWA, Hiroo YONEZU, Akihiro WAKAHARA,
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Abstract(in English) Direct-transition InGaPN/GaPN quntum well (QW) structures were grown on GaP substrates by RF-MBE at 500℃ for application of light emitting devices in monolithic optoelectronic integrated circuits (OEICs) on Si substrates. The bandgap of InGaPN alloys was calculated by the Band Anti-Crossing (BAG) model. The band alignments of the InGaPN/GaPN strained QW structures were estimated. As a result, the valence band offsets of the InGaPN/GaPN QWs with N concentration of 1~2% were 200~300meV, while conduction band offsets were very small. It was shown that an InGaPN quantum well layer needed an N content more than ~4% to obtain the conduction band offset above 300meV.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si / OEIC / InGaPN / GaPN / GaAsPN / III-V-N / dilute nitride / Optical interconnection
Paper # ED2006-32,CPM2006-19,SDM2006-32
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Conference Information
Committee CPM
Conference Date 2006/5/11(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) InGaPN/GaPN Quantum Well Structures for Si/III-V-N Optoelectronic Integrated Circuits
Sub Title (in English)
Keyword(1) Si
Keyword(2) OEIC
Keyword(3) InGaPN
Keyword(4) GaPN
Keyword(5) GaAsPN
Keyword(6) III-V-N
Keyword(7) dilute nitride
Keyword(8) Optical interconnection
1st Author's Name Kazuyuki UMENO
1st Author's Affiliation Toyohashi University of Technology()
2nd Author's Name Sung Man KIM
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name Yuzo FURUKAWA
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name Hiroo YONEZU
4th Author's Affiliation Toyohashi University of Technology
5th Author's Name Akihiro WAKAHARA
5th Author's Affiliation Toyohashi University of Technology
Date 2006-05-19
Paper # ED2006-32,CPM2006-19,SDM2006-32
Volume (vol) vol.106
Number (no) 46
Page pp.pp.-
#Pages 6
Date of Issue