Presentation	2006-04-14 Worst-Case Analysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability Yasumasa TSUKAMOTO, Koji NII, Susumu IMAOKA, Yuji ODA, Shigeki OHBAYASHI, Makoto YABUUCHI, Hiroshi MAKINO, Koichiro ISHIBASHI, Hirofumi SHINOHARA,
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Abstract(in English)	The 6T-SRAM cells in the sub-100nm CMOS generation are now being exposed to a fatal risk that originates from large local Vth variability (σ_). In this paper, to achieve high-yield SRAM array in presence of random σ_ component, we propose a worst-case analysis that determines the boundary of the stable Vth region for SRAM read/write DC margin (Vth Curve). Applying this method to our original 65nm SPICE model, we show some characteristic behavior of the Vth Curve. Throughout this paper, we suggest new criteria to discuss SRAM array stability with Vth variability.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	SRAM / Static Noise Margin / Local Vth Variability / Design for Manufacturability
Paper #	ICD2006-18
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Committee	ICD
Conference Date	2006/4/6(1days)
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Paper Information
Registration To	Integrated Circuits and Devices (ICD)
Language	ENG
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Worst-Case Analysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability
Sub Title (in English)
Keyword(1)	SRAM
Keyword(2)	Static Noise Margin
Keyword(3)	Local Vth Variability
Keyword(4)	Design for Manufacturability
1st Author's Name	Yasumasa TSUKAMOTO
1st Author's Affiliation	Renesas Technology Corporation()
2nd Author's Name	Koji NII
2nd Author's Affiliation	Renesas Technology Corporation
3rd Author's Name	Susumu IMAOKA
3rd Author's Affiliation	Renesas Design Corporation
4th Author's Name	Yuji ODA
4th Author's Affiliation	Shikino High-Tech
5th Author's Name	Shigeki OHBAYASHI
5th Author's Affiliation	Renesas Technology Corporation
6th Author's Name	Makoto YABUUCHI
6th Author's Affiliation	Renesas Technology Corporation
7th Author's Name	Hiroshi MAKINO
7th Author's Affiliation	Renesas Technology Corporation
8th Author's Name	Koichiro ISHIBASHI
8th Author's Affiliation	Renesas Technology Corporation
9th Author's Name	Hirofumi SHINOHARA
9th Author's Affiliation	Renesas Technology Corporation
Date	2006-04-14
Paper #	ICD2006-18
Volume (vol)	vol.106
Number (no)	2
Page	pp.pp.-
#Pages	6
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