Presentation | 2006-04-13 A 65nm Low-Power Embedded DRAM with Extended Data-Retention Sleep Mode Tomohisa TAKAI, Takeshi NAGAI, Masaharu WADA, Hitoshi IWAI, Mariko KAKU, Atsushi SUZUKI, Naoko ITOGA, Takayuki MIYAZAKI, Hiroyuki TAKENAKA, Takehiko HOJO, Shinji MIYANO, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | An Extended Data Retention (EDR) sleep mode with on-chip ECC and the MT-CMOS technique is proposed for the embedded DRAM stand-by power reduction. In the sleep mode, the retention time is 8 times longer by ECC and the leakage current is reduced to less than 13% compared with normal operation mode. Since ECC operates only in the EDR sleep mode, read/write performance is not degraded. A 65nm low power embedded DRAM macro with 400MHz operation and 0.39mW of data retention power is realized. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Embedded DRAM / Low Power / ECC circuit / MT-CMOS technique |
Paper # | ICD2006-2 |
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Conference Information | |
Committee | ICD |
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Conference Date | 2006/4/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A 65nm Low-Power Embedded DRAM with Extended Data-Retention Sleep Mode |
Sub Title (in English) | |
Keyword(1) | Embedded DRAM |
Keyword(2) | Low Power |
Keyword(3) | ECC circuit |
Keyword(4) | MT-CMOS technique |
1st Author's Name | Tomohisa TAKAI |
1st Author's Affiliation | Toshiba Corporation Semiconductor Company() |
2nd Author's Name | Takeshi NAGAI |
2nd Author's Affiliation | Toshiba Corporation Semiconductor Company |
3rd Author's Name | Masaharu WADA |
3rd Author's Affiliation | Toshiba Corporation Semiconductor Company |
4th Author's Name | Hitoshi IWAI |
4th Author's Affiliation | Toshiba Corporation Semiconductor Company |
5th Author's Name | Mariko KAKU |
5th Author's Affiliation | Toshiba Corporation Semiconductor Company |
6th Author's Name | Atsushi SUZUKI |
6th Author's Affiliation | Toshiba Corporation Semiconductor Company |
7th Author's Name | Naoko ITOGA |
7th Author's Affiliation | Toshiba Corporation Semiconductor Company |
8th Author's Name | Takayuki MIYAZAKI |
8th Author's Affiliation | Toshiba Corporation Semiconductor Company |
9th Author's Name | Hiroyuki TAKENAKA |
9th Author's Affiliation | Toshiba Microelectronics Corporation |
10th Author's Name | Takehiko HOJO |
10th Author's Affiliation | Toshiba Corporation Semiconductor Company |
11th Author's Name | Shinji MIYANO |
11th Author's Affiliation | Toshiba Corporation Semiconductor Company |
Date | 2006-04-13 |
Paper # | ICD2006-2 |
Volume (vol) | vol.106 |
Number (no) | 2 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |