Presentation | 2006-03-03 A scheme of Private Key Agreement Based on Fluctuations of BER in Land Mobile Radio Takayasu KITANO, Akito KITAURA, Hisato IWAI, Hideichi SASAOKA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper proposes a private key sharing scheme using the fluctuations of BER (Bit Error Rate). It utilizes the received BER at the both authorized users as the shared information between them. The BER is a good indicator to characterize the wireless channel because it includes all factors of the propagation path to generate bits errors such as fluctuations of amplitude and phase, delayed waves etc. In order to evaluate the performance of the proposed scheme, numerical simulations are carried out assuming IEEE802.11a system configurations and parameters. The results of the simulations show that the proposed scheme successfully achieves the key sharing at SN ratio of 15dB when it is combined with error deletion and correction schemes. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Information Security / Secret Key Agreement / Land Mobile Radio Communication / Fading Channel / Bit Error Rate |
Paper # | RCS2005-217 |
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Conference Information | |
Committee | RCS |
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Conference Date | 2006/2/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Radio Communication Systems (RCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A scheme of Private Key Agreement Based on Fluctuations of BER in Land Mobile Radio |
Sub Title (in English) | |
Keyword(1) | Information Security |
Keyword(2) | Secret Key Agreement |
Keyword(3) | Land Mobile Radio Communication |
Keyword(4) | Fading Channel |
Keyword(5) | Bit Error Rate |
1st Author's Name | Takayasu KITANO |
1st Author's Affiliation | Dep. of Electronics, Doshisha University() |
2nd Author's Name | Akito KITAURA |
2nd Author's Affiliation | Graduate School of Engineering, Doshisha University |
3rd Author's Name | Hisato IWAI |
3rd Author's Affiliation | Dep. of Electronics, Doshisha University |
4th Author's Name | Hideichi SASAOKA |
4th Author's Affiliation | Dep. of Electronics, Doshisha University |
Date | 2006-03-03 |
Paper # | RCS2005-217 |
Volume (vol) | vol.105 |
Number (no) | 623 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |