Presentation 2006-03-03
A scheme of Private Key Agreement Based on Fluctuations of BER in Land Mobile Radio
Takayasu KITANO, Akito KITAURA, Hisato IWAI, Hideichi SASAOKA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper proposes a private key sharing scheme using the fluctuations of BER (Bit Error Rate). It utilizes the received BER at the both authorized users as the shared information between them. The BER is a good indicator to characterize the wireless channel because it includes all factors of the propagation path to generate bits errors such as fluctuations of amplitude and phase, delayed waves etc. In order to evaluate the performance of the proposed scheme, numerical simulations are carried out assuming IEEE802.11a system configurations and parameters. The results of the simulations show that the proposed scheme successfully achieves the key sharing at SN ratio of 15dB when it is combined with error deletion and correction schemes.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Information Security / Secret Key Agreement / Land Mobile Radio Communication / Fading Channel / Bit Error Rate
Paper # RCS2005-217
Date of Issue

Conference Information
Committee RCS
Conference Date 2006/2/22(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Radio Communication Systems (RCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A scheme of Private Key Agreement Based on Fluctuations of BER in Land Mobile Radio
Sub Title (in English)
Keyword(1) Information Security
Keyword(2) Secret Key Agreement
Keyword(3) Land Mobile Radio Communication
Keyword(4) Fading Channel
Keyword(5) Bit Error Rate
1st Author's Name Takayasu KITANO
1st Author's Affiliation Dep. of Electronics, Doshisha University()
2nd Author's Name Akito KITAURA
2nd Author's Affiliation Graduate School of Engineering, Doshisha University
3rd Author's Name Hisato IWAI
3rd Author's Affiliation Dep. of Electronics, Doshisha University
4th Author's Name Hideichi SASAOKA
4th Author's Affiliation Dep. of Electronics, Doshisha University
Date 2006-03-03
Paper # RCS2005-217
Volume (vol) vol.105
Number (no) 623
Page pp.pp.-
#Pages 6
Date of Issue