Presentation 2006/3/7
Oxygen-doped GeSbTe Phase-change Memory Cells
N. Matsuzaki, K. Kurotsuchi, Y. Matsui, O. Tonomura, N. Yamamoto, Y. Fujisaki, N. Kitai, R. Takemura, K. Osada, S. Hanzawa, H. Moriya, T. Iwasaki, T. Kawahara, N. Takaura, M. Terao, M. Matsuoka, M. Moniwa,
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Abstract(in English) We demonstrated the operation of phase-change memory cells that enabled 1.5-V/100-μA programming through a tungsten-bottom-electrode contact with a diameter of 180nm. This is the lowest power ever reported. This was achieved with oxygen-doped GeSbTe, and resulted from the high electric resistance of the germanium oxides in this material. Germanium oxides were also estimated to restrain the growth of crystal in GeSbTe, and our cells maintained a 10-year thermal lifetime at 100℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Phase-change Memory / GeSbTe / Oxygen doping
Paper # SDM2005-260
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Committee SDM
Conference Date 2006/3/7(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Oxygen-doped GeSbTe Phase-change Memory Cells
Sub Title (in English)
Keyword(1) Phase-change Memory
Keyword(2) GeSbTe
Keyword(3) Oxygen doping
1st Author's Name N. Matsuzaki
1st Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.()
2nd Author's Name K. Kurotsuchi
2nd Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
3rd Author's Name Y. Matsui
3rd Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
4th Author's Name O. Tonomura
4th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
5th Author's Name N. Yamamoto
5th Author's Affiliation Kochi University of Technology
6th Author's Name Y. Fujisaki
6th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
7th Author's Name N. Kitai
7th Author's Affiliation Hitachi ULSI Systems Co., Ltd.
8th Author's Name R. Takemura
8th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
9th Author's Name K. Osada
9th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
10th Author's Name S. Hanzawa
10th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
11th Author's Name H. Moriya
11th Author's Affiliation Hitachi Mechanical Engineering Research Lab., Hitachi, Ltd.
12th Author's Name T. Iwasaki
12th Author's Affiliation Hitachi Mechanical Engineering Research Lab., Hitachi, Ltd.
13th Author's Name T. Kawahara
13th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
14th Author's Name N. Takaura
14th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
15th Author's Name M. Terao
15th Author's Affiliation Hitachi Central Research Laboratory, Hitachi, Ltd.
16th Author's Name M. Matsuoka
16th Author's Affiliation Renesas Technology Corp.
17th Author's Name M. Moniwa
17th Author's Affiliation Renesas Technology Corp.
Date 2006/3/7
Paper # SDM2005-260
Volume (vol) vol.105
Number (no) 654
Page pp.pp.-
#Pages 5
Date of Issue