Presentation | 2006-03-16 Degradation of Tamper Resistant LSI by Parameter Variation of Scaled Devices and its Countermeasures Hiroshi YAMAUCHI, Makoto IKEDA, Kunihiro ASADA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Constant-characteristic power dissipation LSI architecture is proposed as countermeasure of power analysis and electromagnetic analysis. We proposed that variation of threshold voltage can become new side-channel in this tamper-resistant LSI architecture. Based on this proposal, we proposed electromagnetic analysis to tamper-resistant LSI using elemental variation. Proposal analysis simulation to tamper-resistant LSI was actually performed and its validity was confirmed. Furthermore, we proposed countermeasures of proposal analysis and examined prospect of vulnerability in further scaled process. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | elemental variation / tamper resistant LSI / electromagnetic analysis / power analysis / side-channel / DES |
Paper # | IT2005-79,ISEC2005-136,WBS2005-93 |
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Conference Information | |
Committee | ISEC |
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Conference Date | 2006/3/9(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation of Tamper Resistant LSI by Parameter Variation of Scaled Devices and its Countermeasures |
Sub Title (in English) | |
Keyword(1) | elemental variation |
Keyword(2) | tamper resistant LSI |
Keyword(3) | electromagnetic analysis |
Keyword(4) | power analysis |
Keyword(5) | side-channel |
Keyword(6) | DES |
1st Author's Name | Hiroshi YAMAUCHI |
1st Author's Affiliation | Faculty of Engineering, University of Tokyo() |
2nd Author's Name | Makoto IKEDA |
2nd Author's Affiliation | VLSI Design and Education Center, University of Tokyo |
3rd Author's Name | Kunihiro ASADA |
3rd Author's Affiliation | VLSI Design and Education Center, University of Tokyo |
Date | 2006-03-16 |
Paper # | IT2005-79,ISEC2005-136,WBS2005-93 |
Volume (vol) | vol.105 |
Number (no) | 663 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |