Presentation | 2006-03-16 IQ Imbalance Compensation on MB-OFDM with Transmit Diversity Yohei KATO, Tsuyoshi IKUNO, Yukitoshi SANADA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Currently, Multi-band OFDM (MB-OFDM) is considered as one of the modulation schemes of UWB and is actively investigated. It is necessary to provide low cost receivers for consumers in order to receive wide support for MB-OFDM system. Such receivers can be archived by utilizing direct conversion architecture. However, the balance of in-phase component and quadrature-phase component of demodulated signals is lost when direct conversion architecture is used. This phenomenon is called IQ imbalance. In this paper, a way of IQ imbalance compensation using transmit diversity is proposed. This scheme enables the system to overcome the influence of frequency-selective fading and IQ imbalance at the same time. The performance of this scheme is shown through computer simulations. It is shown that IQ imbalance can be compensated accurately with proposed scheme. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | UWB / MB-OFDM / Direct Conversion / IQ Imbalance |
Paper # | IT2005-69,ISEC2005-126,WBS2005-83 |
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Conference Information | |
Committee | ISEC |
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Conference Date | 2006/3/9(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | IQ Imbalance Compensation on MB-OFDM with Transmit Diversity |
Sub Title (in English) | |
Keyword(1) | UWB |
Keyword(2) | MB-OFDM |
Keyword(3) | Direct Conversion |
Keyword(4) | IQ Imbalance |
1st Author's Name | Yohei KATO |
1st Author's Affiliation | Dept. of Electronics and Electrical Engineering, Keio University.() |
2nd Author's Name | Tsuyoshi IKUNO |
2nd Author's Affiliation | Dept. of Electronics and Electrical Engineering, Keio University. |
3rd Author's Name | Yukitoshi SANADA |
3rd Author's Affiliation | Dept. of Electronics and Electrical Engineering, Keio University. |
Date | 2006-03-16 |
Paper # | IT2005-69,ISEC2005-126,WBS2005-83 |
Volume (vol) | vol.105 |
Number (no) | 663 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |