Presentation 2006-03-17
On the Randomness Evaluation Method using NIST Randomness Test
Hidetoshi OKUTOMI, Manabu KANEDA, Kenji YAMAGUCHI, Katsuhiro NAKAMURA,
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Abstract(in English) NIST randomness test is widely used today as statistical evaluation method of the randomness. In this paper, at first, we describe some improper points in the evaluation of the success proportion in the NIST randomness test and next we propose more clear evaluation method in the PROPORTION. The method we propose is achieved repeating the NIST randomness test as many times and observing the degree of the matching between the measurement value's distribution and theoretical distribution (binominal distribution). Using this evaluation method, we show the evaluated results in the success proportion about the sequences generated by DES and SHA-1. Finally, we describe the usefulness of the proposed method using these results.
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Keyword(in English) NIST SP.800-22 / randomness test / proportion / binomial distribution
Paper # IT2005-108,ISEC2005-165,WBS2005-122
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Committee ISEC
Conference Date 2006/3/10(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On the Randomness Evaluation Method using NIST Randomness Test
Sub Title (in English)
Keyword(1) NIST SP.800-22
Keyword(2) randomness test
Keyword(3) proportion
Keyword(4) binomial distribution
1st Author's Name Hidetoshi OKUTOMI
1st Author's Affiliation Technology Planning & Coordinating Division, TOSHIBA INFORMATION SYSTEMS (JAPAN) CORPORATION()
2nd Author's Name Manabu KANEDA
2nd Author's Affiliation Technology Planning & Coordinating Division, TOSHIBA INFORMATION SYSTEMS (JAPAN) CORPORATION
3rd Author's Name Kenji YAMAGUCHI
3rd Author's Affiliation Mathematics and Informatics, Graduate School of Science and Technology, Chiba University
4th Author's Name Katsuhiro NAKAMURA
4th Author's Affiliation Dept. of Mathematics & Informatics, Faculty of Science, Chiba University
Date 2006-03-17
Paper # IT2005-108,ISEC2005-165,WBS2005-122
Volume (vol) vol.105
Number (no) 664
Page pp.pp.-
#Pages 6
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