| Presentation | 2006/2/10 On generation of transition faults test patterns in consideration of the path length in broadside testing Shohei MORISHIMA, Akane TAKUMA, Seiji KAJIHARA, Xiaoqing WEN, Toshiyuki MAEDA, Shuji HAMADA, Yasuo SATO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Shrinking of manufacturing process and improvement in the speed of LSI circuits, and the yield loss by the defects which cause an error with the increase of small delay has been a problem. In this paper, we propose a test generation method that defects transition faults due to the small delay. The proposed method generates test patterns so that the path with the signal transition through a fault site becomes as long as possible. The feature of the proposed method is that we prepare two ATPG algorithms, which are activation-oriented and propagation-oriented, and decide which algorithm should be applied for each fault. Experimental results, in which test patterns generated are evaluated, shows the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Test pattern generation / Scan design / Transition fault |
| Paper # | DC2005-81 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2006/2/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On generation of transition faults test patterns in consideration of the path length in broadside testing |
| Sub Title (in English) | |
| Keyword(1) | Test pattern generation |
| Keyword(2) | Scan design |
| Keyword(3) | Transition fault |
| 1st Author's Name | Shohei MORISHIMA |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Akane TAKUMA |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Seiji KAJIHARA |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Xiaoqing WEN |
| 4th Author's Affiliation | Kyushu Institute of Technology |
| 5th Author's Name | Toshiyuki MAEDA |
| 5th Author's Affiliation | Semiconductor Technology Academic Research Center |
| 6th Author's Name | Shuji HAMADA |
| 6th Author's Affiliation | Semiconductor Technology Academic Research Center |
| 7th Author's Name | Yasuo SATO |
| 7th Author's Affiliation | Semiconductor Technology Academic Research Center |
| Date | 2006/2/10 |
| Paper # | DC2005-81 |
| Volume (vol) | vol.105 |
| Number (no) | 607 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |