| Presentation | 2006/2/10 A New Class of Sequential Circuits with Acyclic Test Generation Complexity Chia Yee Ooi, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper introduces a new class of sequential circuits called acyclically testable sequential circuits, whose test generation complexity is equivalent to that of the acyclic sequential circuits. A procedure to perform test generation on acyclically testable sequential circuits is elaborated and a design-for-test (DFT) method to augment an arbitrary sequential circuit into an acyclically testable sequential circuits is also presented. Since the class of acyclically testable sequential circuits is larger than the class of acyclic sequential circuits, the DFT method results in lower area overhead than the partial scan method and still achieves complete fault efficiency. Besides, we show through experiment that the proposed method contributes to lower test application time compared to partial scan method. Moreover, the proposed method allows at-speed testing while the partial scan method does not. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Acyclic testability / test generation complexity / design-for-test |
| Paper # | DC2005-80 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2006/2/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Class of Sequential Circuits with Acyclic Test Generation Complexity |
| Sub Title (in English) | |
| Keyword(1) | Acyclic testability |
| Keyword(2) | test generation complexity |
| Keyword(3) | design-for-test |
| 1st Author's Name | Chia Yee Ooi |
| 1st Author's Affiliation | Nara Institute of Science and Technology() |
| Date | 2006/2/10 |
| Paper # | DC2005-80 |
| Volume (vol) | vol.105 |
| Number (no) | 607 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |