| Presentation | 2006/2/10 Open Fault Model with Considering Adjacent Lines and its Fault Diagnosis Syuhei KADOYAMA, Kiyoshi TAKECHI, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Kouji YAMAZAKI, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper(Cu) interconnect wires. Under the modern manufacturing technologies, the open defect is the one of the significant issues to maintain the reliability of LSI. The open defects at the interconnects are caused by scratches and/or voids in the interconnects such as wires, contacts, and vias. However, the modeling and techniques for test and diagnosis for open faults have been not established yet. In this paper, we propose new open fault model with considering the affects of adjacent lines. Under the open fault model, the fault is excited depending on the logic values at the adjacent lines that are assigned by the test. Next, we propose the diagnosis method based on the open fault model. We use the detecting/un-detecting information based on the excitation condition with considering the logic values at the adjacent lines and the fault propagation condition to deduce the candidate open fault. Experimental results show that the proposed method based on the detecting/un-detecting information is able to diagnose the open faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | open faults / fault diagnosis / fail tests / pass tesets / detecting/un-detecting information |
| Paper # | DC2005-76 |
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| Committee | DC |
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| Conference Date | 2006/2/10(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Open Fault Model with Considering Adjacent Lines and its Fault Diagnosis |
| Sub Title (in English) | |
| Keyword(1) | open faults |
| Keyword(2) | fault diagnosis |
| Keyword(3) | fail tests |
| Keyword(4) | pass tesets |
| Keyword(5) | detecting/un-detecting information |
| 1st Author's Name | Syuhei KADOYAMA |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University Matsuyama() |
| 2nd Author's Name | Kiyoshi TAKECHI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University Matsuyama |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University Matsuyama |
| 4th Author's Name | Yoshinobu HIGAMI |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University Matsuyama |
| 5th Author's Name | Kouji YAMAZAKI |
| 5th Author's Affiliation | School of Information and Communication, Meiji University Kawasaki |
| 6th Author's Name | Yuzo TAKAMATSU |
| 6th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University Matsuyama |
| Date | 2006/2/10 |
| Paper # | DC2005-76 |
| Volume (vol) | vol.105 |
| Number (no) | 607 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |