Presentation | 2006/2/10 A Statistical Study on Fault Coverage of the Logic BIST with LFSR Satoshi FUKUMOTO, Harunobu KUROKAWA, Masayuki ARAI, Kazuhiko IWASAKI, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper discusses the statistical evaluation for exploring the effective parameter values of a test pattern generator. Those parameter values affect the generation of test pattern sequences whose performances of fault detection differ from one by one. We consider two cases of handling terminal conditions of the fault simulation. One case is that the simulation is terminated by a given number of test patterns. And the other is that by given fault coverage. The results show that the formar case has the advantage of statistically accurate assessment for the exploring overhead, and so on. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | LFSR / BIST / test pattern sequence / fault coverage / residual faults / normal distribution |
Paper # | DC2005-75 |
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Committee | DC |
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Conference Date | 2006/2/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Statistical Study on Fault Coverage of the Logic BIST with LFSR |
Sub Title (in English) | |
Keyword(1) | LFSR |
Keyword(2) | BIST |
Keyword(3) | test pattern sequence |
Keyword(4) | fault coverage |
Keyword(5) | residual faults |
Keyword(6) | normal distribution |
1st Author's Name | Satoshi FUKUMOTO |
1st Author's Affiliation | Tokyo Metropolitan University() |
2nd Author's Name | Harunobu KUROKAWA |
2nd Author's Affiliation | Tokyo Metropolitan University |
3rd Author's Name | Masayuki ARAI |
3rd Author's Affiliation | Tokyo Metropolitan University |
4th Author's Name | Kazuhiko IWASAKI |
4th Author's Affiliation | Tokyo Metropolitan University |
Date | 2006/2/10 |
Paper # | DC2005-75 |
Volume (vol) | vol.105 |
Number (no) | 607 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |