| Presentation | 2006/2/10 Fault Independent/Dependent Test Methods for State-Observable FSMs Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Currently, scan testing is one of the most popular test methods for VLSIs. However, because scan testing is not based on the function, but the structure of the circuit, this method is considered over testing and under testing. While, it is well known that delay testing and at-speed functional testing can effectively improve test quality. Because the specification is explicitly described in FSMs, high test quality is expected by performing logical testing and timing testing. This paper proposes two test methods, a fault independent test generation method and a fault dependent test generation method, for state-observable FSMs. The test generation methods are based on a single pattern test for logical testing and a two pattern test for timing testing. Experimental results for MCNC'91 benchmark circuits show that the use of our method reduces the average area by 13.2% while the 1 state transition coverage is increased 4.3 times by using only 13.4% additional test sequences compared with the conventional non-scan test method for FSMs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | State observable / Over testing / Under testing / Fault dependent test generation / Fault independent test eneration / tate transition coverage |
| Paper # | DC2005-74 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2006/2/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fault Independent/Dependent Test Methods for State-Observable FSMs |
| Sub Title (in English) | |
| Keyword(1) | State observable |
| Keyword(2) | Over testing |
| Keyword(3) | Under testing |
| Keyword(4) | Fault dependent test generation |
| Keyword(5) | Fault independent test eneration |
| Keyword(6) | tate transition coverage |
| 1st Author's Name | Ryoichi INOUE |
| 1st Author's Affiliation | College of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Hideo FUJIWARA |
| 3rd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology(NAIST) |
| Date | 2006/2/10 |
| Paper # | DC2005-74 |
| Volume (vol) | vol.105 |
| Number (no) | 607 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |