Presentation 2006/2/10
Fault Independent/Dependent Test Methods for State-Observable FSMs
Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA,
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Abstract(in English) Currently, scan testing is one of the most popular test methods for VLSIs. However, because scan testing is not based on the function, but the structure of the circuit, this method is considered over testing and under testing. While, it is well known that delay testing and at-speed functional testing can effectively improve test quality. Because the specification is explicitly described in FSMs, high test quality is expected by performing logical testing and timing testing. This paper proposes two test methods, a fault independent test generation method and a fault dependent test generation method, for state-observable FSMs. The test generation methods are based on a single pattern test for logical testing and a two pattern test for timing testing. Experimental results for MCNC'91 benchmark circuits show that the use of our method reduces the average area by 13.2% while the 1 state transition coverage is increased 4.3 times by using only 13.4% additional test sequences compared with the conventional non-scan test method for FSMs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) State observable / Over testing / Under testing / Fault dependent test generation / Fault independent test eneration / tate transition coverage
Paper # DC2005-74
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Committee DC
Conference Date 2006/2/10(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Fault Independent/Dependent Test Methods for State-Observable FSMs
Sub Title (in English)
Keyword(1) State observable
Keyword(2) Over testing
Keyword(3) Under testing
Keyword(4) Fault dependent test generation
Keyword(5) Fault independent test eneration
Keyword(6) tate transition coverage
1st Author's Name Ryoichi INOUE
1st Author's Affiliation College of Industrial Technology, Nihon University()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Hideo FUJIWARA
3rd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology(NAIST)
Date 2006/2/10
Paper # DC2005-74
Volume (vol) vol.105
Number (no) 607
Page pp.pp.-
#Pages 8
Date of Issue