Presentation 2006-02-27
Dielectric Measurement by Waveguide-Type Microscopic Aperture Probe
Toshitatsu SUZUKI, Kenichi SUGIMOTO, Yuki YAMAGAMI, adahiro NEGISHI, Yasuo WATANABE,
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Abstract(in English) For dielectric constant measurement of areas smaller than the wavelength, this paper proposes a method of employing waveguide-type microscopic aperture probe. The probe is made of WR-15 waveguide with one end shielded with metal plate of 0.3mm, on which a 0.5mm-dia or a 0.1mm-dia aperture is made. The dielectric constant is derived from the slope of phase difference swept over 50-70 GHz between the cases of free-space transmission with and without the dielectrics. In order to evaluate the system, the dielectric constant of PTFE (Teflon) has been measured by three cases of using the probes of 0.5mm-dia and 0.1mm-dia, and two V-band corrugated horns. The results show good agreement.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) permittivity / waveguide / microscopic aperture / PTFE / millimeter/submillimeter wave
Paper # SANE2005-100
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Committee SANE
Conference Date 2006/2/20(1days)
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Registration To Space, Aeronautical and Navigational Electronics (SANE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Dielectric Measurement by Waveguide-Type Microscopic Aperture Probe
Sub Title (in English)
Keyword(1) permittivity
Keyword(2) waveguide
Keyword(3) microscopic aperture
Keyword(4) PTFE
Keyword(5) millimeter/submillimeter wave
1st Author's Name Toshitatsu SUZUKI
1st Author's Affiliation Faculty of Engineering, Nippon Institute of Technology()
2nd Author's Name Kenichi SUGIMOTO
2nd Author's Affiliation Faculty of Engineering, Nippon Institute of Technology
3rd Author's Name Yuki YAMAGAMI
3rd Author's Affiliation Faculty of Engineering, Nippon Institute of Technology
4th Author's Name adahiro NEGISHI
4th Author's Affiliation Faculty of Engineering, Nippon Institute of Technology
5th Author's Name Yasuo WATANABE
5th Author's Affiliation Faculty of Engineering, Nippon Institute of Technology
Date 2006-02-27
Paper # SANE2005-100
Volume (vol) vol.105
Number (no) 618
Page pp.pp.-
#Pages 4
Date of Issue