Presentation | 2006-02-27 Dielectric Measurement by Waveguide-Type Microscopic Aperture Probe Toshitatsu SUZUKI, Kenichi SUGIMOTO, Yuki YAMAGAMI, adahiro NEGISHI, Yasuo WATANABE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | For dielectric constant measurement of areas smaller than the wavelength, this paper proposes a method of employing waveguide-type microscopic aperture probe. The probe is made of WR-15 waveguide with one end shielded with metal plate of 0.3mm, on which a 0.5mm-dia or a 0.1mm-dia aperture is made. The dielectric constant is derived from the slope of phase difference swept over 50-70 GHz between the cases of free-space transmission with and without the dielectrics. In order to evaluate the system, the dielectric constant of PTFE (Teflon) has been measured by three cases of using the probes of 0.5mm-dia and 0.1mm-dia, and two V-band corrugated horns. The results show good agreement. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | permittivity / waveguide / microscopic aperture / PTFE / millimeter/submillimeter wave |
Paper # | SANE2005-100 |
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Conference Information | |
Committee | SANE |
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Conference Date | 2006/2/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Space, Aeronautical and Navigational Electronics (SANE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Dielectric Measurement by Waveguide-Type Microscopic Aperture Probe |
Sub Title (in English) | |
Keyword(1) | permittivity |
Keyword(2) | waveguide |
Keyword(3) | microscopic aperture |
Keyword(4) | PTFE |
Keyword(5) | millimeter/submillimeter wave |
1st Author's Name | Toshitatsu SUZUKI |
1st Author's Affiliation | Faculty of Engineering, Nippon Institute of Technology() |
2nd Author's Name | Kenichi SUGIMOTO |
2nd Author's Affiliation | Faculty of Engineering, Nippon Institute of Technology |
3rd Author's Name | Yuki YAMAGAMI |
3rd Author's Affiliation | Faculty of Engineering, Nippon Institute of Technology |
4th Author's Name | adahiro NEGISHI |
4th Author's Affiliation | Faculty of Engineering, Nippon Institute of Technology |
5th Author's Name | Yasuo WATANABE |
5th Author's Affiliation | Faculty of Engineering, Nippon Institute of Technology |
Date | 2006-02-27 |
Paper # | SANE2005-100 |
Volume (vol) | vol.105 |
Number (no) | 618 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |