Presentation | 2006-02-17 Development of Test Circuit for Spotty Byte Error Control Codes Takeshi SASADA, Haruhiko KANEKO, Hideki IMASHIRO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Error control coding is essential for semiconductor memory systems used in the space radiation environment because single event upsets (SEUs) are often observed in these memory systems. Conventional error control codes, such as Hamming codes and Reed-Solomon (RS) codes, are not necessarily suitable for the memory systems, because Hamming codes cannot correct random multiple-bit errors while RS codes require a large number of check bits for large byte length b. Recently, a new class of error control codes suitable for correcting multiple bit errors in a byte, called spotty byte error control codes, has been proposed. This report presents development of encoder and parallel decoder for three classes of RS codes and for three classes of spotty byte error control codes, which are implemented using an FPGA. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Single-Event Effect / ECC / Spotty byte error / Reed-Solomon code / encoder/decode circuit |
Paper # | SAT2005-57 |
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Committee | SAT |
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Conference Date | 2006/2/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Satellite Telecommunications (SAT) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Development of Test Circuit for Spotty Byte Error Control Codes |
Sub Title (in English) | |
Keyword(1) | Single-Event Effect |
Keyword(2) | ECC |
Keyword(3) | Spotty byte error |
Keyword(4) | Reed-Solomon code |
Keyword(5) | encoder/decode circuit |
1st Author's Name | Takeshi SASADA |
1st Author's Affiliation | Japan Aerospace Exploration Agency Tsukuba Space Center() |
2nd Author's Name | Haruhiko KANEKO |
2nd Author's Affiliation | Japan Aerospace Exploration Agency Tsukuba Space Center |
3rd Author's Name | Hideki IMASHIRO |
3rd Author's Affiliation | Hitachi Information Technology Co., Ltd. |
Date | 2006-02-17 |
Paper # | SAT2005-57 |
Volume (vol) | vol.105 |
Number (no) | 605 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |