Presentation | 2006-01-26 Single-photon-induced random-telegraph-signal in Si multidot structure Ratno NURYADI, Yasuhiko ISHIKAWA, Michiharu TABE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A single-photon detection using a Si-based two-dimensional (2D) multiple dots field-effect transistor (FET) is reported. The single photon is detected as a random-telegraph-signal (RTS) in the single-hole-tunneling current regime. The frequency of RTS events depends on the light wavelength and intensity, indicating that RTS occurs due to the single-photon absorption in the Si dots. Based on a Monte Carlo simulation using an equivalent circuit representing the 2D multijunction FET, the "on" state of RTS appears when the photogenerated charge in the dot sensitively shifts the current level, while the "on" state returns to the "off" state when the charged-dot is neutralized. The simulation result also shows that RTS is triggered not only by the charging of a dot near the current percolation path, but also the charging of a dot distant away from the path due to the nature of the multijunction system, i.e., the long screening length of the charge-induced potential. This result opens up the development of single-photon devices with 2D multijunction system. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Si multidot structure / Single-hole-tunneling / Random-telegraph-signal / Single-photon-detection |
Paper # | ED2005-230,SDM2005-242 |
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Committee | ED |
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Conference Date | 2006/1/19(1days) |
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Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Single-photon-induced random-telegraph-signal in Si multidot structure |
Sub Title (in English) | |
Keyword(1) | Si multidot structure |
Keyword(2) | Single-hole-tunneling |
Keyword(3) | Random-telegraph-signal |
Keyword(4) | Single-photon-detection |
1st Author's Name | Ratno NURYADI |
1st Author's Affiliation | Research Inst. of Electronics, Shizuoka University() |
2nd Author's Name | Yasuhiko ISHIKAWA |
2nd Author's Affiliation | Research Inst. of Electronics, Shizuoka University |
3rd Author's Name | Michiharu TABE |
3rd Author's Affiliation | Research Inst. of Electronics, Shizuoka University |
Date | 2006-01-26 |
Paper # | ED2005-230,SDM2005-242 |
Volume (vol) | vol.105 |
Number (no) | 549 |
Page | pp.pp.- |
#Pages | 4 |
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