Presentation 2006-01-26
Single-photon-induced random-telegraph-signal in Si multidot structure
Ratno NURYADI, Yasuhiko ISHIKAWA, Michiharu TABE,
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Abstract(in English) A single-photon detection using a Si-based two-dimensional (2D) multiple dots field-effect transistor (FET) is reported. The single photon is detected as a random-telegraph-signal (RTS) in the single-hole-tunneling current regime. The frequency of RTS events depends on the light wavelength and intensity, indicating that RTS occurs due to the single-photon absorption in the Si dots. Based on a Monte Carlo simulation using an equivalent circuit representing the 2D multijunction FET, the "on" state of RTS appears when the photogenerated charge in the dot sensitively shifts the current level, while the "on" state returns to the "off" state when the charged-dot is neutralized. The simulation result also shows that RTS is triggered not only by the charging of a dot near the current percolation path, but also the charging of a dot distant away from the path due to the nature of the multijunction system, i.e., the long screening length of the charge-induced potential. This result opens up the development of single-photon devices with 2D multijunction system.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si multidot structure / Single-hole-tunneling / Random-telegraph-signal / Single-photon-detection
Paper # ED2005-230,SDM2005-242
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Committee ED
Conference Date 2006/1/19(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Single-photon-induced random-telegraph-signal in Si multidot structure
Sub Title (in English)
Keyword(1) Si multidot structure
Keyword(2) Single-hole-tunneling
Keyword(3) Random-telegraph-signal
Keyword(4) Single-photon-detection
1st Author's Name Ratno NURYADI
1st Author's Affiliation Research Inst. of Electronics, Shizuoka University()
2nd Author's Name Yasuhiko ISHIKAWA
2nd Author's Affiliation Research Inst. of Electronics, Shizuoka University
3rd Author's Name Michiharu TABE
3rd Author's Affiliation Research Inst. of Electronics, Shizuoka University
Date 2006-01-26
Paper # ED2005-230,SDM2005-242
Volume (vol) vol.105
Number (no) 549
Page pp.pp.-
#Pages 4
Date of Issue