Presentation | 2006-01-19 High Power AlGaN/GaN MIS-HEMT Masahito KANAMURA, Toshihide KIKKAWA, Taisuke IWAI, Kenji IMANISHI, Tokuro KUBO, Kazukiyo JOSHIN, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A state-of-the-art large gate-periphery n-GaN/n-AlGaN/GaN MIS-HEMTs were fabricated on a S.I.-SiC substrate. The forward gate leakage current of the GaN MIS-HEMT was eighth orders of magnitude lower than that of the Schottky gate HEMT and the 2-terminal gate to drain reverse breakdown voltage of the GaN MIS-HEMT reaches greater than 400V. The single chip GaN MIS-HEMT amplifier operated at 60V achieves a high output power of 110W at 2.14GHz. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | AlGaN/GaN HEMT / Base Station / MIS / Si_3N_4 |
Paper # | ED2005-208,MW2005-162 |
Date of Issue |
Conference Information | |
Committee | ED |
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Conference Date | 2006/1/12(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | High Power AlGaN/GaN MIS-HEMT |
Sub Title (in English) | |
Keyword(1) | AlGaN/GaN HEMT |
Keyword(2) | Base Station |
Keyword(3) | MIS |
Keyword(4) | Si_3N_4 |
1st Author's Name | Masahito KANAMURA |
1st Author's Affiliation | Fujitsu Laboratories Ltd.() |
2nd Author's Name | Toshihide KIKKAWA |
2nd Author's Affiliation | Fujitsu Laboratories Ltd. |
3rd Author's Name | Taisuke IWAI |
3rd Author's Affiliation | Fujitsu Laboratories Ltd. |
4th Author's Name | Kenji IMANISHI |
4th Author's Affiliation | Fujitsu Laboratories Ltd. |
5th Author's Name | Tokuro KUBO |
5th Author's Affiliation | Fujitsu Laboratories Ltd. |
6th Author's Name | Kazukiyo JOSHIN |
6th Author's Affiliation | Fujitsu Laboratories Ltd. |
Date | 2006-01-19 |
Paper # | ED2005-208,MW2005-162 |
Volume (vol) | vol.105 |
Number (no) | 521 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |