Presentation | 2006-01-18 Effects of surface recombination on dc characteristics of InGaP/GaAs heterojunction bipolar transistors Airi KUROKAWA, Zhi JIN, Hiroshi ONO, Kazuo Uchida, Shinji NOZAKI, Hiroshi MORISAKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | InGaP/GaAs heterojunction bipolar transistors (HBT's) with various sizes of the emitter were fabricated only using the wet etching process, and the effects of surface passivation on the dc characteristics of the HBT's were studied. The passivation suppresses the surface recombination in the extrinsic base region and the emitter size effect. Although the sulfur passivation is effective, the InGaP ledge passivation is most effective to obtain a high current gain and low surface recombination current. The InGaP ledge passivation also improves the reliability of the HBT's after the current stress. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Heterojunction bipolar transistors(HBT's) / InGaP/GaAs / surface Recombination / Emitter size effect / stress test |
Paper # | ED2005-198,MW2005-152 |
Date of Issue |
Conference Information | |
Committee | ED |
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Conference Date | 2006/1/11(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Effects of surface recombination on dc characteristics of InGaP/GaAs heterojunction bipolar transistors |
Sub Title (in English) | |
Keyword(1) | Heterojunction bipolar transistors(HBT's) |
Keyword(2) | InGaP/GaAs |
Keyword(3) | surface Recombination |
Keyword(4) | Emitter size effect |
Keyword(5) | stress test |
1st Author's Name | Airi KUROKAWA |
1st Author's Affiliation | University of Electro-Communications() |
2nd Author's Name | Zhi JIN |
2nd Author's Affiliation | University of Electro-Communications |
3rd Author's Name | Hiroshi ONO |
3rd Author's Affiliation | University of Electro-Communications |
4th Author's Name | Kazuo Uchida |
4th Author's Affiliation | University of Electro-Communications |
5th Author's Name | Shinji NOZAKI |
5th Author's Affiliation | University of Electro-Communications |
6th Author's Name | Hiroshi MORISAKI |
6th Author's Affiliation | University of Electro-Communications |
Date | 2006-01-18 |
Paper # | ED2005-198,MW2005-152 |
Volume (vol) | vol.105 |
Number (no) | 520 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |