| Presentation | 2006-01-27 Temperature dependencies of return currents in Bi_2Sr_2CaCu_2O_x stacks fabricated by self-planarizing process K. Okanoue, R. Fachamroon, M. Suzuki, N. Yokawa, H. Suematsu, H. Shimakage, Z. Wang, K. Hamasaki, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We investigated the temperature dependence of the critical current (I_c) and return current (I_r) of stacked Bi-2212 intrinsic Josephson junctions fabricated by self-planarizing process. In atomic microscopy (AFM), no step was observed at the edge of the junction window for the sample soaking it into the dilute hydrochloric (≤0.2 %) acid for 5s. The I_c-T characteristics of the stacks stay well above Ambegaokar-Baratoff (AB) theory at higher temperatures than 40 K. On the other hand, the I_r-T characteristics gradually increase with increasing temperature. The observed I_r-T characteristics were explained by Zappe theory based on the simple RCSJ model with temperature dependent c-axis resistivity of the stacks. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Bi-2212 stack / intrinsic Josephson junction / self-planarizing process |
| Paper # | SCE2005-25 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2006/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Temperature dependencies of return currents in Bi_2Sr_2CaCu_2O_x stacks fabricated by self-planarizing process |
| Sub Title (in English) | |
| Keyword(1) | Bi-2212 stack |
| Keyword(2) | intrinsic Josephson junction |
| Keyword(3) | self-planarizing process |
| 1st Author's Name | K. Okanoue |
| 1st Author's Affiliation | Nagaoka University of Technology() |
| 2nd Author's Name | R. Fachamroon |
| 2nd Author's Affiliation | Nagaoka University of Technology |
| 3rd Author's Name | M. Suzuki |
| 3rd Author's Affiliation | Nagaoka University of Technology |
| 4th Author's Name | N. Yokawa |
| 4th Author's Affiliation | Nagaoka University of Technology |
| 5th Author's Name | H. Suematsu |
| 5th Author's Affiliation | Nagaoka University of Technology |
| 6th Author's Name | H. Shimakage |
| 6th Author's Affiliation | KARC, National Institute of Information and Communications Technology |
| 7th Author's Name | Z. Wang |
| 7th Author's Affiliation | KARC, National Institute of Information and Communications Technology |
| 8th Author's Name | K. Hamasaki |
| 8th Author's Affiliation | Nagaoka University of Technology |
| Date | 2006-01-27 |
| Paper # | SCE2005-25 |
| Volume (vol) | vol.105 |
| Number (no) | 575 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |