Presentation 2006-01-26
Influence of time jitter on the measurement of impulse response
Shouhei YANO, Yuu HATANO, Shouji SHIMADA,
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Abstract(in English) The time jitter generated in the analog/digital converter (AD/DA) causes errors during impulse response measurements. We carry out an experiment for studying the influence of time jitter on the accuracy of impulse response measurements. In the experimental system, time jitter is digitally generated. The system can control the distortion due to time jitter without special hardware. We use the system to consider the impact of the time jitter on two impulse response measurement methods : Time Stretched Pulse (TS P) and Maximum-length sequence (M-sequence). We find that TSP performance depends on the amplitude change in the TSP signal at each sample. The TSP method is shown to be more robust than the M-sequence method with regard to time jitter. We propose a method based on complex cepstrum analysis that can, in combination with either TSP or M-sequence, better resist the effects of time jitter.
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Keyword(in English) impulse response / time jitter / Time stretched pulse / M-sequence / complex cepstrum
Paper # EA2005-94
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Committee EA
Conference Date 2006/1/19(1days)
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Registration To Engineering Acoustics (EA)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influence of time jitter on the measurement of impulse response
Sub Title (in English)
Keyword(1) impulse response
Keyword(2) time jitter
Keyword(3) Time stretched pulse
Keyword(4) M-sequence
Keyword(5) complex cepstrum
1st Author's Name Shouhei YANO
1st Author's Affiliation Department of Electrical and Electronic Systems Engineering, Nagaoka National College of Technology()
2nd Author's Name Yuu HATANO
2nd Author's Affiliation Department of Electrical and Electronic Systems Engineering, Nagaoka National College of Technology
3rd Author's Name Shouji SHIMADA
3rd Author's Affiliation Nagaoka University of Technology
Date 2006-01-26
Paper # EA2005-94
Volume (vol) vol.105
Number (no) 555
Page pp.pp.-
#Pages 6
Date of Issue