Presentation 2006-02-02
Numerical analysis of light-wave diffraction from an aperture of a metallic layer : Application of the FDTD method combined with the motion equation of electron
Shinya KAGAWA, Yiwei HE, Toshitaka KOJIMA,
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Abstract(in English) Recently, a density growth is demanded in optical storage technologies. But, It is said that the upper limit of recording density by the current optical recording system is several tens of gigabits per inch square due to the optical diffraction limit even in the case of using a short wavelength. Then, as a technology that enables us to break down the optical diffraction limit, the optical near field technology has gotten a lot of attention. In this paper, we try to two-dimensional numerical analysis of electric field distributions near a metallic nanoaperture that generates an optical near field using the FDTD(Finite Difference Time Domain) method. We also carry out numerical analysis of readout characteristics of a recording mark of the disk model that consists of the nanoaperture and the phase change disk structure. In the present analysis, the FDTD method combined with the motion equation of electron is applied to a metallic medium whose permittivity can become negative at the optical wavelength range.
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Keyword(in English) Optical near field / Optical recording / Nanoaperture / Metal / FDTD method
Paper # PN2005-88,OFT2005-75,OPE2005-136,LQE2005-151
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Conference Information
Committee LQE
Conference Date 2006/1/26(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Numerical analysis of light-wave diffraction from an aperture of a metallic layer : Application of the FDTD method combined with the motion equation of electron
Sub Title (in English)
Keyword(1) Optical near field
Keyword(2) Optical recording
Keyword(3) Nanoaperture
Keyword(4) Metal
Keyword(5) FDTD method
1st Author's Name Shinya KAGAWA
1st Author's Affiliation Graduate School, Kansai University()
2nd Author's Name Yiwei HE
2nd Author's Affiliation Faculty of Engineering, Osaka Electro-Communication University
3rd Author's Name Toshitaka KOJIMA
3rd Author's Affiliation Graduate School, Kansai University
Date 2006-02-02
Paper # PN2005-88,OFT2005-75,OPE2005-136,LQE2005-151
Volume (vol) vol.105
Number (no) 593
Page pp.pp.-
#Pages 6
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