Presentation 2006/1/20
Polycrystallization phenomenon and form a film condition of OLED material
Norihiro OISHI, Shigehisa ODA, Tatsuo MORI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We observed the polycrystallization phenomenon of NPD and TPD thin films under a controlled atmosphere. When we compared NPD with the that of TPD, it has been understood that the polycrystallization of TPD is faster than that of NPD. Moreover, it was statistically clarified that the polycrystallization is accelerated with increasing the preservation temperature. The polycrystallization were controlled in the cast method when TPD thin films on ITO fabricated by the vacuum deposition and cast method.
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Keyword(in English) organic light-emitting diode(OLED) / NPD / TPD / polycrystallization
Paper # OME2005-104
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Committee OME
Conference Date 2006/1/20(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Polycrystallization phenomenon and form a film condition of OLED material
Sub Title (in English)
Keyword(1) organic light-emitting diode(OLED)
Keyword(2) NPD
Keyword(3) TPD
Keyword(4) polycrystallization
1st Author's Name Norihiro OISHI
1st Author's Affiliation TOPPAN FORMS CO., LTD.()
2nd Author's Name Shigehisa ODA
2nd Author's Affiliation Department of Electrical Engineering and Computer Science, Graduate School of Engineering Nagoya University
3rd Author's Name Tatsuo MORI
3rd Author's Affiliation Department of Electrical Engineering and Computer Science, Graduate School of Engineering Nagoya University
Date 2006/1/20
Paper # OME2005-104
Volume (vol) vol.105
Number (no) 576
Page pp.pp.-
#Pages 5
Date of Issue