| Presentation | 2002/6/24 The effect of interface trap charges on poly-Si TFT Kook Chul Moon, Min-Chul Lee, Jae-Hoon Lee, Min-Koo Han, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It is presented that the band mobility of polycrystalline silicon thin film transistor is mostly governed by the interface traps in case of the same grain size and that the mobility contains the parameter related with interface traps. Our proposed model includes parameters related with interface trap charges as well as grain boundary trap charges. The new method successfully explains that the large interface trap degrades the mobility. It is also possible to extract the interface trap charges from I-V transfer characteristics using our new model. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | poly-Si TFT / effective mobility / interface charge / modeling |
| Paper # | ED2002-153 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2002/6/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | The effect of interface trap charges on poly-Si TFT |
| Sub Title (in English) | |
| Keyword(1) | poly-Si TFT |
| Keyword(2) | effective mobility |
| Keyword(3) | interface charge |
| Keyword(4) | modeling |
| 1st Author's Name | Kook Chul Moon |
| 1st Author's Affiliation | School of Electrical Engineering, Seoul National University() |
| 2nd Author's Name | Min-Chul Lee |
| 2nd Author's Affiliation | School of Electrical Engineering, Seoul National University |
| 3rd Author's Name | Jae-Hoon Lee |
| 3rd Author's Affiliation | School of Electrical Engineering, Seoul National University |
| 4th Author's Name | Min-Koo Han |
| 4th Author's Affiliation | School of Electrical Engineering, Seoul National University |
| Date | 2002/6/24 |
| Paper # | ED2002-153 |
| Volume (vol) | vol.102 |
| Number (no) | 175 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |