Presentation 2002/6/24
A new DRAM Cell for SoC (System on a Chip) Devices : Planar DRAM Cell, Based On Logic Process
Seoyong CHI, Jeongho CHO, Yongcheol JEONG, Choongho HWANG, Junghwan LEE,
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Abstract(in English) A new DRAM Cell for SoC (System on a Chip) Devices is introduced and discussed. An improvement in electrical characteristics of DRAM Cell is obtained by PMOS type cell instead of NMOS. It is of DRAM Cell's leakage currents. The leakage currents are related to data retention time. The PMOS DRAM Cell also results in lower capacitance and lower tr. performance. However, the good data retention time may outweigh the disadvantages and can significantly improve DRAM characteristics in SoC Product. For the substrate (N-Well) bias condition of PMOS DRAM Cell higher than operating voltage (Vcc), it is good immunity for noises and voltage's bouncing on a chip level. This detailed study shows that the PMOS DRAM Cell has several unique advantages over the NMOS DRAM Scheme such as a small cell tr. leakage current and cell capacitor's leakage. Also, it is suitable for high-performance logic devices included in DRAM's.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SoC(System on a Chip) / DRAM Cell / Logic Device
Paper # ED2002-117
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Committee ED
Conference Date 2002/6/24(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A new DRAM Cell for SoC (System on a Chip) Devices : Planar DRAM Cell, Based On Logic Process
Sub Title (in English)
Keyword(1) SoC(System on a Chip)
Keyword(2) DRAM Cell
Keyword(3) Logic Device
1st Author's Name Seoyong CHI
1st Author's Affiliation System IC R&D Center, Hynix Semiconductor Inc.()
2nd Author's Name Jeongho CHO
2nd Author's Affiliation System IC R&D Center, Hynix Semiconductor Inc.
3rd Author's Name Yongcheol JEONG
3rd Author's Affiliation System IC R&D Center, Hynix Semiconductor Inc.
4th Author's Name Choongho HWANG
4th Author's Affiliation System IC R&D Center, Hynix Semiconductor Inc.
5th Author's Name Junghwan LEE
5th Author's Affiliation System IC R&D Center, Hynix Semiconductor Inc.
Date 2002/6/24
Paper # ED2002-117
Volume (vol) vol.102
Number (no) 175
Page pp.pp.-
#Pages 3
Date of Issue