Presentation 2002/4/9
Relationship Between the Crystal Growth of poly-Si and Hydrogen Deposited on the SiO_2 / SiN / Glass Substrate Using ELA Method
Naoya KAWAMOTO, Hisashi ABE, Naoto MATSUO, Ryohei TAGUCHI, Tomoyuki NOUDA, Hiroki HAMADA,
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Abstract(in English) In this study, we clarify the difference of the Raman peak shift and full width at half maximum (FWHM) between the poly-Si films which were recrystallized on three types of substrates, SiO_2 / SiN / glass (SiN), SiO_2 / glass (SiO_2) and quartz substrate, and the behavior of the hydrogen molecules in the SiN film. The nucleation models considering the hydrogen molecules and the thermal conductance are also discussed. It is clarified by optical method for the first time that the crystallinity of the recrystallized poly-Si strongly depends on the substrate film structure. For the poly-Si on the SiN substrate, it is considered that the dominant nucleation site is generated in the Si-liquid by the H_2 burst during the ELA. For the poly-Si on the SiO_2 or quartz substrate, the dominant nucleation site is the defect of the a-Si / SiO_2 or quartz interface, because the crystal growth proceeds from the bottom to the surface of poly-Si according to the thermal distribution.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) excimer laser annealing / SiN substrate / poly-Si / hydrogen molecules / burst / crystal growth mechanism
Paper # OME2002-3
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Committee OME
Conference Date 2002/4/9(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Relationship Between the Crystal Growth of poly-Si and Hydrogen Deposited on the SiO_2 / SiN / Glass Substrate Using ELA Method
Sub Title (in English)
Keyword(1) excimer laser annealing
Keyword(2) SiN substrate
Keyword(3) poly-Si
Keyword(4) hydrogen molecules
Keyword(5) burst
Keyword(6) crystal growth mechanism
1st Author's Name Naoya KAWAMOTO
1st Author's Affiliation Dept. Electric. & Electron. Eng., Yamaguchi Univ.()
2nd Author's Name Hisashi ABE
2nd Author's Affiliation Microelectronics Research Center, SANYO Electric Co., Ltd.
3rd Author's Name Naoto MATSUO
3rd Author's Affiliation Dept. Electric. & Electron. Eng., Yamaguchi Univ.
4th Author's Name Ryohei TAGUCHI
4th Author's Affiliation Dept. Electric. & Electron. Eng., Yamaguchi Univ.
5th Author's Name Tomoyuki NOUDA
5th Author's Affiliation Microelectronics Research Center, SANYO Electric Co., Ltd.
6th Author's Name Hiroki HAMADA
6th Author's Affiliation Microelectronics Research Center, SANYO Electric Co., Ltd.
Date 2002/4/9
Paper # OME2002-3
Volume (vol) vol.102
Number (no) 8
Page pp.pp.-
#Pages 4
Date of Issue