Presentation | 2002/4/9 Analysis of Reliability of Low-Temperature poly-Si TFTs with Gate-Overlapped LDD H Nakagawa, T Kawakita, H Yano, T Hatayama, Y Uraoka, T Fuyuki, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have discussed the degradation mechanism of the Low Temperature Poly-Si GOLD(Gate-Overlapped LDD) Structure TFTs using two-dimensional device simulator. We have calculated distributions of horizontal electric field, vertical field and free carriers for various doping conditions and various bias conditions systematically. Hot carriers are generated far from the interface by the strong vertical electric field. Therefore, less hot electrons are injected into gate oxide. Therefore, the GOLD Structure is suitable for a high performance driving circuit. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Low Temperature Poly-Si TFTs / GOLD / Reliability / Hot carriers / Electric field |
Paper # | OME2002-2 |
Date of Issue |
Conference Information | |
Committee | OME |
---|---|
Conference Date | 2002/4/9(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Organic Material Electronics (OME) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of Reliability of Low-Temperature poly-Si TFTs with Gate-Overlapped LDD |
Sub Title (in English) | |
Keyword(1) | Low Temperature Poly-Si TFTs |
Keyword(2) | GOLD |
Keyword(3) | Reliability |
Keyword(4) | Hot carriers |
Keyword(5) | Electric field |
1st Author's Name | H Nakagawa |
1st Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology() |
2nd Author's Name | T Kawakita |
2nd Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology |
3rd Author's Name | H Yano |
3rd Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology |
4th Author's Name | T Hatayama |
4th Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology |
5th Author's Name | Y Uraoka |
5th Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology |
6th Author's Name | T Fuyuki |
6th Author's Affiliation | Graduate School of Materials Science, Nara Institute of Science and Technology |
Date | 2002/4/9 |
Paper # | OME2002-2 |
Volume (vol) | vol.102 |
Number (no) | 8 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |