| 講演名 | 2005/11/10 The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals(Contact Phenomena) , |
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| PDFダウンロードページ | PDFダウンロードページへ |
| 抄録(和) | |
| 抄録(英) | Serious environmental contamination influenced the reliability of gold plated connectors in some handed terminals. Gold plated contacts disassembled from failed handed terminals were tarnished and worn. Contact resistance was tested on the crunodes of a rectangular lattice on contaminated contacts on printed circuit board (PCB). The contour distribution of contact resistance was consistent with the morphology of contaminants on the PCB contact, which was caused by the increased contact resistance on contamination. Contaminants causing failure usually located at or near the ends of wear tracks in contact zones, where the thickness of contaminants was highest. As the coverage areas of contamination expanded, the average thickness of contaminants increased, the value of contact resistance rose and the probability of higher contact resistance increased at same time. The distribution of contact resistance on PCB contacts was not complied with the normal distribution. |
| キーワード(和) | |
| キーワード(英) | contact resistance / contamination / micro-motion / gold plating / handed terminals |
| 資料番号 | EMD2005-65 |
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| 研究会情報 | |
| 研究会 | EMD |
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| 開催期間 | 2005/11/10(から1日開催) |
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| 講演論文情報詳細 | |
| 申込み研究会 | Electromechanical Devices (EMD) |
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| 本文の言語 | ENG |
| タイトル（和） | |
| サブタイトル（和） | |
| タイトル（英） | The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals(Contact Phenomena) |
| サブタイトル（和） | |
| キーワード(1)（和/英） | / contact resistance |
| 第 1 著者 氏名（和/英） | / Yi Lin ZHOU |
| 第 1 著者 所属（和/英） | Lab of Electric Contacts, Automation School, Beijing University of Posts and Telecommunications |
| 発表年月日 | 2005/11/10 |
| 資料番号 | EMD2005-65 |
| 巻番号（vol） | vol.105 |
| 号番号（no） | 412 |
| ページ範囲 | pp.- |
| ページ数 | 5 |
| 発行日 | |