| Presentation | 2005/11/10 The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals(Contact Phenomena) Yi Lin ZHOU, Qiu Jie XU, Liang Jun XU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Serious environmental contamination influenced the reliability of gold plated connectors in some handed terminals. Gold plated contacts disassembled from failed handed terminals were tarnished and worn. Contact resistance was tested on the crunodes of a rectangular lattice on contaminated contacts on printed circuit board (PCB). The contour distribution of contact resistance was consistent with the morphology of contaminants on the PCB contact, which was caused by the increased contact resistance on contamination. Contaminants causing failure usually located at or near the ends of wear tracks in contact zones, where the thickness of contaminants was highest. As the coverage areas of contamination expanded, the average thickness of contaminants increased, the value of contact resistance rose and the probability of higher contact resistance increased at same time. The distribution of contact resistance on PCB contacts was not complied with the normal distribution. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | contact resistance / contamination / micro-motion / gold plating / handed terminals |
| Paper # | EMD2005-65 |
| Date of Issue |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2005/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals(Contact Phenomena) |
| Sub Title (in English) | |
| Keyword(1) | contact resistance |
| Keyword(2) | contamination |
| Keyword(3) | micro-motion |
| Keyword(4) | gold plating |
| Keyword(5) | handed terminals |
| 1st Author's Name | Yi Lin ZHOU |
| 1st Author's Affiliation | Lab of Electric Contacts, Automation School, Beijing University of Posts and Telecommunications() |
| 2nd Author's Name | Qiu Jie XU |
| 2nd Author's Affiliation | Lab of Electric Contacts, Automation School, Beijing University of Posts and Telecommunications |
| 3rd Author's Name | Liang Jun XU |
| 3rd Author's Affiliation | Lab of Electric Contacts, Automation School, Beijing University of Posts and Telecommunications |
| Date | 2005/11/10 |
| Paper # | EMD2005-65 |
| Volume (vol) | vol.105 |
| Number (no) | 412 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |