Presentation 2005/11/17
Measurement of conductive polymer/metal interface barrier by internal photoelectron emission spectroscopy
Yoshihito Horiuchi, Eiji Itoh, Keiichi Miyairi,
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Abstract(in English) We have investigated the barrier height of conductive polymer/metal interface by using internal photoelectron emission spectroscopy(IPES). Firstly, the current-voltage characteristics of ITO/MEH-PPV/Al single-layerd device under very low (2-10mHz) frequency of triangular voltage revealed that MEH-PPV layer performs as dielectric film rather than the shottky diode. Secondly, the energy barrier height of Al-HOMO, ITO-LUMO interface was estimated as 1.1eV and 1.45eV by IPES technique. Finally, the energy barrier height of Al-LUMO interface was estimated as 1.25eV in ITO/Al_2O_3(200nm)/MEH-PPV/Al device
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Keyword(in English) Internal photoelectron emission spectroscopy / Barrier height / MEH-PPV
Paper # OME2005-85
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Committee OME
Conference Date 2005/11/17(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of conductive polymer/metal interface barrier by internal photoelectron emission spectroscopy
Sub Title (in English)
Keyword(1) Internal photoelectron emission spectroscopy
Keyword(2) Barrier height
Keyword(3) MEH-PPV
1st Author's Name Yoshihito Horiuchi
1st Author's Affiliation Faculty of Engineering, Shinshu University()
2nd Author's Name Eiji Itoh
2nd Author's Affiliation /
3rd Author's Name Keiichi Miyairi
3rd Author's Affiliation
Date 2005/11/17
Paper # OME2005-85
Volume (vol) vol.105
Number (no) 425
Page pp.pp.-
#Pages 5
Date of Issue