| Presentation | 2005-11-10 On the Complexity of Fault Testing for Reversible Circuits Shigeru ITO, Yusuke ITO, Satoshi TAYU, Shuichi UENO, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on a set of wires of a reversible circuit. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Fault testing / NP-complete / reversible circuit |
| Paper # | CAS2005-51,CST2005-20 |
| Date of Issue |
| Conference Information | |
| Committee | CAS |
|---|---|
| Conference Date | 2005/11/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Circuits and Systems (CAS) |
|---|---|
| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On the Complexity of Fault Testing for Reversible Circuits |
| Sub Title (in English) | |
| Keyword(1) | Fault testing |
| Keyword(2) | NP-complete |
| Keyword(3) | reversible circuit |
| 1st Author's Name | Shigeru ITO |
| 1st Author's Affiliation | Department of Communications and Integrated Systems, Tokyo Institute of Technology() |
| 2nd Author's Name | Yusuke ITO |
| 2nd Author's Affiliation | Department of Communications and Integrated Systems, Tokyo Institute of Technology |
| 3rd Author's Name | Satoshi TAYU |
| 3rd Author's Affiliation | Department of Communications and Integrated Systems, Tokyo Institute of Technology |
| 4th Author's Name | Shuichi UENO |
| 4th Author's Affiliation | Department of Communications and Integrated Systems, Tokyo Institute of Technology |
| Date | 2005-11-10 |
| Paper # | CAS2005-51,CST2005-20 |
| Volume (vol) | vol.105 |
| Number (no) | 387 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |