Presentation | 2005-10-14 Mutual Inductance Coupled through a Superconducting Magnetic Isolation Layer Yoshinao MIZUGAKI, Hidemitsu HAKII, Masataka MORIYA, Kouichi USAMI, Tadayuki KOBAYASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Magnetic isolation is an important issue in the realization of Josephson LSIs. Although a subterranean power line structure has been introduced in the state-of-the-art Nb integration technology, flux penetration through a superconducting shielding layer of finite thickness has not been fully investigated. In this report, we demonstrate our quantitative evaluation of mutual inductance coupled through a superconducting thin film by means of both numerical calculation (using the FastHenry program) and experiments (using the SQUID method). We confirm that the measured values of mutual inductance agree with the numerical ones. The results proves that the mutual coupling is reduced with increasing the shield layer width, but that the finite mutual coupling remains even at the widest shield layer both in our numerical and experimental situations. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | mutual inductance / magnetic shield / Meissner effect / SQUID / FastHenry |
Paper # | SCE2005-20 |
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Conference Information | |
Committee | SCE |
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Conference Date | 2005/10/7(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Mutual Inductance Coupled through a Superconducting Magnetic Isolation Layer |
Sub Title (in English) | |
Keyword(1) | mutual inductance |
Keyword(2) | magnetic shield |
Keyword(3) | Meissner effect |
Keyword(4) | SQUID |
Keyword(5) | FastHenry |
1st Author's Name | Yoshinao MIZUGAKI |
1st Author's Affiliation | Department of Electronic Engineering, The University of Electro-Communications() |
2nd Author's Name | Hidemitsu HAKII |
2nd Author's Affiliation | Department of Electronic Engineering, The University of Electro-Communications |
3rd Author's Name | Masataka MORIYA |
3rd Author's Affiliation | Department of Electronic Engineering, The University of Electro-Communications |
4th Author's Name | Kouichi USAMI |
4th Author's Affiliation | Department of Electronic Engineering, The University of Electro-Communications |
5th Author's Name | Tadayuki KOBAYASHI |
5th Author's Affiliation | Department of Electronic Engineering, The University of Electro-Communications |
Date | 2005-10-14 |
Paper # | SCE2005-20 |
Volume (vol) | vol.105 |
Number (no) | 334 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |