Presentation 2005-10-14
Mutual Inductance Coupled through a Superconducting Magnetic Isolation Layer
Yoshinao MIZUGAKI, Hidemitsu HAKII, Masataka MORIYA, Kouichi USAMI, Tadayuki KOBAYASHI,
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Abstract(in English) Magnetic isolation is an important issue in the realization of Josephson LSIs. Although a subterranean power line structure has been introduced in the state-of-the-art Nb integration technology, flux penetration through a superconducting shielding layer of finite thickness has not been fully investigated. In this report, we demonstrate our quantitative evaluation of mutual inductance coupled through a superconducting thin film by means of both numerical calculation (using the FastHenry program) and experiments (using the SQUID method). We confirm that the measured values of mutual inductance agree with the numerical ones. The results proves that the mutual coupling is reduced with increasing the shield layer width, but that the finite mutual coupling remains even at the widest shield layer both in our numerical and experimental situations.
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Keyword(in English) mutual inductance / magnetic shield / Meissner effect / SQUID / FastHenry
Paper # SCE2005-20
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Committee SCE
Conference Date 2005/10/7(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Mutual Inductance Coupled through a Superconducting Magnetic Isolation Layer
Sub Title (in English)
Keyword(1) mutual inductance
Keyword(2) magnetic shield
Keyword(3) Meissner effect
Keyword(4) SQUID
Keyword(5) FastHenry
1st Author's Name Yoshinao MIZUGAKI
1st Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications()
2nd Author's Name Hidemitsu HAKII
2nd Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
3rd Author's Name Masataka MORIYA
3rd Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
4th Author's Name Kouichi USAMI
4th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
5th Author's Name Tadayuki KOBAYASHI
5th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
Date 2005-10-14
Paper # SCE2005-20
Volume (vol) vol.105
Number (no) 334
Page pp.pp.-
#Pages 5
Date of Issue