Presentation 2005-10-21
A Phase Noise Minimization of CMOS LC-VCOs over Wide Tuning Range and Large PVT Variations
Daisuke MIYASHITA, Hiroki ISHIKURO, Shouhei KOUSAI, Hiroyuki KOBAYASHI, Hideaki MAJIMA, Kenichi AGAWA, Mototsugu HAMADA,
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Abstract(in English) An automatic amplitude control (AAC) circuit to minimize the phase noise of a LC-VCO is proposed and implemented by a 0.18-μm CMOS process. The phase noise lower than -90dBc/Hz at 100kHz offset is achieved over a wide tuning range (from 2.2GHz to 2.8GHz) under large process (ΔV_=±100mV), temperature (from -35℃ to 85℃), and power supply (from 1.8V to 3V) variations.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) RFCMOS / LC-VCO / Phase Noise / Automatic Amplitude Control / PVT variation
Paper # SIP2005-115,ICD2005-134,IE2005-79
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Committee IE
Conference Date 2005/10/14(1days)
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Registration To Image Engineering (IE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Phase Noise Minimization of CMOS LC-VCOs over Wide Tuning Range and Large PVT Variations
Sub Title (in English)
Keyword(1) RFCMOS
Keyword(2) LC-VCO
Keyword(3) Phase Noise
Keyword(4) Automatic Amplitude Control
Keyword(5) PVT variation
1st Author's Name Daisuke MIYASHITA
1st Author's Affiliation SoC Research and Development Center, Toshiba Corporation()
2nd Author's Name Hiroki ISHIKURO
2nd Author's Affiliation SoC Research and Development Center, Toshiba Corporation
3rd Author's Name Shouhei KOUSAI
3rd Author's Affiliation SoC Research and Development Center, Toshiba Corporation
4th Author's Name Hiroyuki KOBAYASHI
4th Author's Affiliation SoC Research and Development Center, Toshiba Corporation
5th Author's Name Hideaki MAJIMA
5th Author's Affiliation SoC Research and Development Center, Toshiba Corporation
6th Author's Name Kenichi AGAWA
6th Author's Affiliation SoC Research and Development Center, Toshiba Corporation
7th Author's Name Mototsugu HAMADA
7th Author's Affiliation SoC Research and Development Center, Toshiba Corporation
Date 2005-10-21
Paper # SIP2005-115,ICD2005-134,IE2005-79
Volume (vol) vol.105
Number (no) 354
Page pp.pp.-
#Pages 5
Date of Issue