| Presentation | 2005-10-27 Calibration Services of Metrological High-Frequency Impedance Standards and Evaluation of Residual Error in Vector Network Analyzer Masahiro Horibe, Masaaki Shida, Koji Komiyama, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | By increase in the use of the mobile devices using high-frequency technologies in the general public, high-frequency standards be becoming more and more important in the industries. NMIJ-AIST use the feedback from market needs to establish the calibration services for high-frequency impedance, and develop the coaxial high-frequency impedance standards with Type-N and PC-3.5 connectors. There are important to develop and evaluate the standards, measurement system and its method for calibration services. The development and evaluation of impedance standards and measurement method have been reported. So, we report the way of evaluating VNA uncertainties which is major in the total uncertainty of measurement. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | high-frequency coaxial impedance / PC-7 connector / Vector network analyzer / Residual uncertainty |
| Paper # | EMCJ2005-84,MW2005-90 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2005/10/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Calibration Services of Metrological High-Frequency Impedance Standards and Evaluation of Residual Error in Vector Network Analyzer |
| Sub Title (in English) | |
| Keyword(1) | high-frequency coaxial impedance |
| Keyword(2) | PC-7 connector |
| Keyword(3) | Vector network analyzer |
| Keyword(4) | Residual uncertainty |
| 1st Author's Name | Masahiro Horibe |
| 1st Author's Affiliation | National Institutes of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ)() |
| 2nd Author's Name | Masaaki Shida |
| 2nd Author's Affiliation | National Institutes of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) |
| 3rd Author's Name | Koji Komiyama |
| 3rd Author's Affiliation | National Institutes of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) |
| Date | 2005-10-27 |
| Paper # | EMCJ2005-84,MW2005-90 |
| Volume (vol) | vol.105 |
| Number (no) | 366 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |