Presentation | 2005-10-27 Complex permittivity measurement of liquid by free space reflection method Masahiro HANAZAWA, Kaori FUKUNAGA, Atsuhiro NISHIKATA, Soichi WATANABE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this study, we attempted to investigate measurement of a dielectric constant of a liquid by free space reflection method using lens antenna. Initially, we study the influence of a thickness of a liquid comparing calculated results. Consequently, it is confirmed that measure it enough if there is three wavelengh or more. Next, the difference between the calibration plane and liquid level was examined. If the difference is 0.001λ or less, it has been understood not to become a big error marign factor. And, it is measured a complex pemittivity of water. As a results, these are good agreement with values which were measured by probe method. Moreover, mode transitions were changed and dielectric constant was measured up to 65GHz. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Free-Space Method / Complex Permittivity Measurement / Liquids / Lens Antenna |
Paper # | EMCJ2005-81,MW2005-87 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2005/10/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Complex permittivity measurement of liquid by free space reflection method |
Sub Title (in English) | |
Keyword(1) | Free-Space Method |
Keyword(2) | Complex Permittivity Measurement |
Keyword(3) | Liquids |
Keyword(4) | Lens Antenna |
1st Author's Name | Masahiro HANAZAWA |
1st Author's Affiliation | National Institute of Information and Communications Technology, EMC Center() |
2nd Author's Name | Kaori FUKUNAGA |
2nd Author's Affiliation | National Institute of Information and Communications Technology, EMC Center |
3rd Author's Name | Atsuhiro NISHIKATA |
3rd Author's Affiliation | National Institute of Information and Communications Technology, EMC Center:Tokyo Institute of Technology |
4th Author's Name | Soichi WATANABE |
4th Author's Affiliation | National Institute of Information and Communications Technology, EMC Center |
Date | 2005-10-27 |
Paper # | EMCJ2005-81,MW2005-87 |
Volume (vol) | vol.105 |
Number (no) | 366 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |