| Presentation | 2005-10-20 A Novel Soft-Error Immune TCAM Architecture with Associated Embedded DRAM Yuji Yano, Hideyuki Noda, Katsumi Dosaka, Fukashi Morishita, Kazunari Inoue, Toshiyuki Ogawa, Kazutami Arimoto, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Decreasing soft-error rate is necessary for SRAM-based TCAM which has high-performance and large memory capacity. Conventional ECC technique improves soft-error immunity of RAMs, but it is not suitable for TCAMs. The searching performance of TCAM with ECC circuit degrades seriously because of freezing their look-up processing during the maintenance period. This paper describes a novel TCAM architecture with associated embedded DRAM. The design concept improves the soft error immunity by 6digits, and also resolves the critical problems of the look-up table maintenance of TCAM. The proposed architecture in this paper is especially attractive for realizing soft-error immune, high-performance TCAM chips. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | TCAM / Embedded DRAM / Soft-error / ECC |
| Paper # | SIP2005-112,ICD2005-131,IE2005-76 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2005/10/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Novel Soft-Error Immune TCAM Architecture with Associated Embedded DRAM |
| Sub Title (in English) | |
| Keyword(1) | TCAM |
| Keyword(2) | Embedded DRAM |
| Keyword(3) | Soft-error |
| Keyword(4) | ECC |
| 1st Author's Name | Yuji Yano |
| 1st Author's Affiliation | Renesas Technology Corporation() |
| 2nd Author's Name | Hideyuki Noda |
| 2nd Author's Affiliation | Renesas Technology Corporation |
| 3rd Author's Name | Katsumi Dosaka |
| 3rd Author's Affiliation | Renesas Technology Corporation |
| 4th Author's Name | Fukashi Morishita |
| 4th Author's Affiliation | Renesas Technology Corporation |
| 5th Author's Name | Kazunari Inoue |
| 5th Author's Affiliation | Renesas Technology Corporation |
| 6th Author's Name | Toshiyuki Ogawa |
| 6th Author's Affiliation | Renesas Technology Corporation |
| 7th Author's Name | Kazutami Arimoto |
| 7th Author's Affiliation | Renesas Technology Corporation |
| Date | 2005-10-20 |
| Paper # | SIP2005-112,ICD2005-131,IE2005-76 |
| Volume (vol) | vol.105 |
| Number (no) | 351 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |