Presentation	2002/7/11 Near-field measurement using Yee scheme and far-field imaging HIROSHI Hirayama, Yoshio KAMI,
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Abstract(in English)	In this paper, we propose a new method to acquire Poynting vector distribution by means of measuring electric (E) and magnetic (H) distributions in a near field. An experiment has been performed to obtain a near-field distribution for a transmission line having risers above a ground plane. Furthermore, we discuss on the relation between the near-field distribution and far-field imaging. We point out that the emitting field distribution is similar to the Poynting-vector distribution rather than the near-field distribution itself.
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Keyword(in English)	Yee Scheme / Near fileld measurement / Poynting vector / Emitting source imaging
Paper #	EMCJ2002-32
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Conference Information
Committee	EMCJ
Conference Date	2002/7/11(1days)
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Paper Information
Registration To	Electromagnetic Compatibility (EMCJ)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Near-field measurement using Yee scheme and far-field imaging
Sub Title (in English)
Keyword(1)	Yee Scheme
Keyword(2)	Near fileld measurement
Keyword(3)	Poynting vector
Keyword(4)	Emitting source imaging
1st Author's Name	HIROSHI Hirayama
1st Author's Affiliation	Department of Information and Communication Engineering University of Electro-Communications()
2nd Author's Name	Yoshio KAMI
2nd Author's Affiliation	Department of Information and Communication Engineering University of Electro-Communications
Date	2002/7/11
Paper #	EMCJ2002-32
Volume (vol)	vol.102
Number (no)	210
Page	pp.pp.-
#Pages	6
Date of Issue