Presentation 2005/12/9
Investigation of RF relay
Nozomi MIKI, Yousuke KAWAKAMI, Koichiro SAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the telecommunications sector such as cellular phones, the movement that shifts to the high frequency is strong, and a mechanical switch is reviewed from a past semiconductor switch. However, Seeing from the viewpoint of the contact phenomena there are a lot of problems. In this report, we introduce two papers presenter at Holm in 2005 about MEMS and one paper about electromechanical RF relays, and then discuss contact phenomena of RF MEMS for the next generation wireless communication that will be expected in the future.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MEMS / RF / Hot Switching / Contact Reliability
Paper # EMD2005-99
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Conference Information
Committee EMD
Conference Date 2005/12/9(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation of RF relay
Sub Title (in English)
Keyword(1) MEMS
Keyword(2) RF
Keyword(3) Hot Switching
Keyword(4) Contact Reliability
1st Author's Name Nozomi MIKI
1st Author's Affiliation Department of System Design Engineering Faculty of Science and Technology, Keio University()
2nd Author's Name Yousuke KAWAKAMI
2nd Author's Affiliation Department of System Design Engineering Faculty of Science and Technology, Keio University
3rd Author's Name Koichiro SAWA
3rd Author's Affiliation Department of System Design Engineering Faculty of Science and Technology, Keio University
Date 2005/12/9
Paper # EMD2005-99
Volume (vol) vol.105
Number (no) 485
Page pp.pp.-
#Pages 6
Date of Issue