Presentation | 2005/12/9 Investigation of RF relay Nozomi MIKI, Yousuke KAWAKAMI, Koichiro SAWA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In the telecommunications sector such as cellular phones, the movement that shifts to the high frequency is strong, and a mechanical switch is reviewed from a past semiconductor switch. However, Seeing from the viewpoint of the contact phenomena there are a lot of problems. In this report, we introduce two papers presenter at Holm in 2005 about MEMS and one paper about electromechanical RF relays, and then discuss contact phenomena of RF MEMS for the next generation wireless communication that will be expected in the future. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | MEMS / RF / Hot Switching / Contact Reliability |
Paper # | EMD2005-99 |
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Committee | EMD |
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Conference Date | 2005/12/9(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Investigation of RF relay |
Sub Title (in English) | |
Keyword(1) | MEMS |
Keyword(2) | RF |
Keyword(3) | Hot Switching |
Keyword(4) | Contact Reliability |
1st Author's Name | Nozomi MIKI |
1st Author's Affiliation | Department of System Design Engineering Faculty of Science and Technology, Keio University() |
2nd Author's Name | Yousuke KAWAKAMI |
2nd Author's Affiliation | Department of System Design Engineering Faculty of Science and Technology, Keio University |
3rd Author's Name | Koichiro SAWA |
3rd Author's Affiliation | Department of System Design Engineering Faculty of Science and Technology, Keio University |
Date | 2005/12/9 |
Paper # | EMD2005-99 |
Volume (vol) | vol.105 |
Number (no) | 485 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |